Extraction of trapped ions from the Tokyo Electron Beam Ion Trap

K Motohashi, J Asada, FJ Currell, T Fukami, T Hirayama, K Mochiji, Nobuyuki Nakamura, E Nojikawa, K Okazaki, S Ohtani, M Sakurai, H Shiraishi, S Tsurubuchi, H Watanabe

Research output: Contribution to journalArticlepeer-review

Abstract

A beam line for transporting highly charged ions extracted from the Tokyo Electron Beam Ion Trap is being constructed in order to study ion-surface interactions and to inject into secondary ion traps for atomic physics experiments. A basic idea for the design and a computer modeling for the extraction system are described. The results of a test experiment to detect the total number of ions extracted from the EBIT are also reported.
Original languageEnglish
Pages (from-to)368-370
JournalPhysica Scripta
VolumeT73
Publication statusPublished - 1997

Research Beacons, Institutes and Platforms

  • Dalton Nuclear Institute

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