Fe M2,3 X-ray resonant magnetic reflectivity on epitaxial Fe3-δO4 thin films

N. D. Telling, A. Haznar, G. Van der Laan, M. D. Roper, F. Schedin, G. Thornton

    Research output: Contribution to journalArticlepeer-review

    Abstract

    We report the use of soft X-ray resonant reflectivity at the Fe M 2,3 edges to probe the magnetic circular dichroism of non-stoichiometric Fe3-δO4 thin films grown epitaxially on Al2O3. Photon energy scans of the magnetic dichroism display features that arise from the different Fe cation sites, with relative intensities that depend on the incident angle of the X-rays. Comparisons are made between the dichroism measured with this technique and X-ray magnetic circular dichroism calculated for the three Fe sites in magnetite. © 2003 Elsevier B.V. All rights reserved.
    Original languageEnglish
    Pages (from-to)157-160
    Number of pages3
    JournalPhysica B: Condensed Matter
    Volume345
    Issue number1-4
    DOIs
    Publication statusPublished - 1 Mar 2004

    Keywords

    • Absorption
    • M edge
    • Magnetite
    • Resonant reflectivity
    • XMCD

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