| Original language | English |
|---|---|
| Pages (from-to) | 1114-1115 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 10 |
| Issue number | S02 |
| Publication status | Published - 2004 |
Focused Ion Beam Microscopy of Oxide Dispersion Strengthened Molybdenum
R Baranwal, MG Burke, MW Phaneuf
Research output: Contribution to journal › Article › peer-review