Fundamental crystal growth mechanism in zeolite L revealed by atomic force microscopy

Rhea Brent; Michael W. Anderson

doi:10.1002/anie.200800977

Fundamental crystal growth mechanism in zeolite L revealed by atomic force microscopy

Rhea Brent, Michael W. Anderson

Research output: Contribution to journal › Article › peer-review

Abstract

Scratching the surface: Atomic force microscopy has been utilized to study the surface of zeolite L (see AFM image of the hexgonal face of a crystal). Correlations between nanometer high features and the structural units have been determined, with the smallest unit protruding from the surface corresponding to a single cancrinite cage. The mechanism by which growth units attach depends on the crystallographic face. (Figure Presented). © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.

Original language	English
Pages (from-to)	5327-5330
Number of pages	3
Journal	Angewandte Chemie - International Edition
Volume	47
Issue number	29
DOIs	https://doi.org/10.1002/anie.200800977
Publication status	Published - 7 Jul 2008

Keywords

Atomic force microscopy
Crystal growth
Habit control
Surface chemistry
Zeolites

Access to Document

10.1002/anie.200800977

http://www3.interscience.wiley.com/cgi-bin/fulltext/119817174/PDFSTART

Cite this

@article{09fcb181aa864947b295d9cd47272b62,

title = "Fundamental crystal growth mechanism in zeolite L revealed by atomic force microscopy",

abstract = "Scratching the surface: Atomic force microscopy has been utilized to study the surface of zeolite L (see AFM image of the hexgonal face of a crystal). Correlations between nanometer high features and the structural units have been determined, with the smallest unit protruding from the surface corresponding to a single cancrinite cage. The mechanism by which growth units attach depends on the crystallographic face. (Figure Presented). {\textcopyright} 2008 Wiley-VCH Verlag GmbH & Co. KGaA.",

keywords = "Atomic force microscopy, Crystal growth, Habit control, Surface chemistry, Zeolites",

author = "Rhea Brent and Anderson, {Michael W.}",

note = "Brent, Rhea Anderson, Michael W. 8 WILEY-V C H VERLAG GMBH WEINHEIM 325PQ",

year = "2008",

month = jul,

day = "7",

doi = "10.1002/anie.200800977",

language = "English",

volume = "47",

pages = "5327--5330",

journal = "Angewandte Chemie - International Edition",

issn = "1433-7851",

publisher = "John Wiley & Sons Ltd",

number = "29",

}

TY - JOUR

T1 - Fundamental crystal growth mechanism in zeolite L revealed by atomic force microscopy

AU - Brent, Rhea

AU - Anderson, Michael W.

N1 - Brent, Rhea Anderson, Michael W. 8 WILEY-V C H VERLAG GMBH WEINHEIM 325PQ

PY - 2008/7/7

Y1 - 2008/7/7

N2 - Scratching the surface: Atomic force microscopy has been utilized to study the surface of zeolite L (see AFM image of the hexgonal face of a crystal). Correlations between nanometer high features and the structural units have been determined, with the smallest unit protruding from the surface corresponding to a single cancrinite cage. The mechanism by which growth units attach depends on the crystallographic face. (Figure Presented). © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.

AB - Scratching the surface: Atomic force microscopy has been utilized to study the surface of zeolite L (see AFM image of the hexgonal face of a crystal). Correlations between nanometer high features and the structural units have been determined, with the smallest unit protruding from the surface corresponding to a single cancrinite cage. The mechanism by which growth units attach depends on the crystallographic face. (Figure Presented). © 2008 Wiley-VCH Verlag GmbH & Co. KGaA.

KW - Atomic force microscopy

KW - Crystal growth

KW - Habit control

KW - Surface chemistry

KW - Zeolites

U2 - 10.1002/anie.200800977

DO - 10.1002/anie.200800977

M3 - Article

SN - 1433-7851

VL - 47

SP - 5327

EP - 5330

JO - Angewandte Chemie - International Edition

JF - Angewandte Chemie - International Edition

IS - 29

ER -

Fundamental crystal growth mechanism in zeolite L revealed by atomic force microscopy

Abstract

Keywords

Access to Document

Fingerprint

Cite this