GaN metal-oxide-semiconductor high-electron-mobility transistors using thermally evaporated SiO as the gate dielectric

Gengchang Zhu, Yiming Wang, Qian Xin, Mingsheng Xu, Xiufang Chen, Xiangang Xu, Xianjin Feng, Aimin Song

    Research output: Contribution to journalArticlepeer-review

    283 Downloads (Pure)

    Fingerprint

    Dive into the research topics of 'GaN metal-oxide-semiconductor high-electron-mobility transistors using thermally evaporated SiO as the gate dielectric'. Together they form a unique fingerprint.

    Material Science

    Engineering