GaN surface sputter damage investigated using deep level transient spectroscopy

Xiaoyan Tang, Simon Hammersley, Vladimir Markevich, Ian Hawkins, Iain Crowe, Trevor Martin, Tony Peaker, Matthew Halsall

Research output: Contribution to journal › Article › peer-review

1 results

Finished
Instrument to identify defects and impurities in wide band gap semiconductors via excited states
Halsall, M. (PI), Crowe, I. (CoI) & Peaker, A. (CoI)
1/03/17 → 29/02/20
Project: Research