Abstract
Alternative regimes for the growth of GaN/InGaN quantum wells in a close coupled showerhead reactor have been investigated and their respective merits discussed. State-of-the-art characteristics have been seen from the best structures using 300 and 6 K photoluminescence, high-resolution X-ray diffraction, atomic force microscopy and transmission electron microscopy to characterize the material. The fabrication of high-quality electroluminescent devices from selected structures has shown the practical relevance of these studies. © 2002 Elsevier Science B.V. All rights reserved.
Original language | English |
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Title of host publication | Journal of Crystal Growth|J Cryst Growth |
Editors | A. Krost, B. Mullin, M. Weyers |
Place of Publication | Journal of Crystal Growth |
Publisher | Elsevier BV |
Pages | 518-522 |
Number of pages | 4 |
Volume | 248 |
DOIs | |
Publication status | Published - Feb 2003 |
Event | Proceedings of the eleventh international conference on MOVPE XI - Berlin Duration: 1 Feb 2003 → … |
Conference
Conference | Proceedings of the eleventh international conference on MOVPE XI |
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City | Berlin |
Period | 1/02/03 → … |
Keywords
- A1. Photoluminescence
- A1. X-ray diffraction
- A3. Metalorganic vapor phase deposition
- A3. Quantum wells
- B1. Nitrides