TY - JOUR
T1 - Gate-controlled field emission current from MoS2 nanosheets
AU - Pelella, Aniello
AU - Grillo, Alessandro
AU - Urban, Francesca
AU - Giubileo, Filippo
AU - Passacantando, Maurizio
AU - Pollmann, Erik
AU - Sleziona, Stephan
AU - Schleberger, Marika
AU - Di Bartolomeo, Antonio
PY - 2020/12/28
Y1 - 2020/12/28
N2 - Monolayer molybdenum disulfide (MoS2) nanosheets, obtained via chemical vapor deposition onto SiO2/Si substrates, are exploited to fabricate field-effect transistors with n-type conduction, high on/off ratio, steep subthreshold slope, and good mobility. The transistor channel conductance increases with the reducing air pressure due to oxygen and water desorption. Local field emission measurements from the edges of the MoS2 nanosheets are performed in high vacuum using a tip-shaped anode. It is demonstrated that the voltage applied to the Si substrate back-gate modulates the field emission current. Such a finding, that it is attributed to gate-bias lowering of the MoS2 electron affinity, enables a new field-effect transistor based on field emission.
AB - Monolayer molybdenum disulfide (MoS2) nanosheets, obtained via chemical vapor deposition onto SiO2/Si substrates, are exploited to fabricate field-effect transistors with n-type conduction, high on/off ratio, steep subthreshold slope, and good mobility. The transistor channel conductance increases with the reducing air pressure due to oxygen and water desorption. Local field emission measurements from the edges of the MoS2 nanosheets are performed in high vacuum using a tip-shaped anode. It is demonstrated that the voltage applied to the Si substrate back-gate modulates the field emission current. Such a finding, that it is attributed to gate-bias lowering of the MoS2 electron affinity, enables a new field-effect transistor based on field emission.
UR - https://www.scopus.com/pages/publications/85098188486
U2 - 10.1002/aelm.202000838
DO - 10.1002/aelm.202000838
M3 - Article
SN - 2199-160X
VL - 7
SP - 2000838
JO - Advanced Electronic Materials
JF - Advanced Electronic Materials
IS - 2
ER -