Abstract
We show that excess noise in micron-sized samples fabricated from Si-doped GaAs/GaAlAs quantum wells and heterostructures is a strong non-monotonic function of temperature with several sharp peaks below room temperature. The noise power at the peaks exceeds the background noise by several orders of magnitude. The observed behaviour represents a classical noise source where only a single type of switching defect with a well-defined activation energy is present. We attribute the resonances to deep metastable donors and provisionally identify one of the donors as the known DX-centre in GaAs and GaAlAs. © 1994.
Original language | English |
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Pages (from-to) | 1011-1014 |
Number of pages | 3 |
Journal | Solid State Electronics |
Volume | 37 |
Issue number | 4-6 |
Publication status | Published - Apr 1994 |
Keywords
- dx centers
- fluctuations
- spectroscopy
- silicon
- traps