Glancing angle synchrotron x-ray diffraction

R J Cernik

Glancing angle synchrotron x-ray diffraction

Research output: Contribution to conference › Paper › peer-review

Abstract

This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the x-ray region and cover reflectivity, diffraction from polycryst. films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed. Two examples of the reflectivity from multilayers and the diffraction from Fe oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the exptl. geometries that can be employed are described. A brief bibliog. is provided at the end to accompany this part of the 1996 Frascati school. [on SciFinder(R)]

Original language	English
Pages	205-224
Number of pages	20
Publication status	Published - 1996
Event	THIN FILM CHARACTERISATION BY ADVANCED X-RAY DIFFRACTION TECHNIQUES - Frascati, Italy Duration: 2 Oct 1996 → 5 Oct 1996

Conference

Conference	THIN FILM CHARACTERISATION BY ADVANCED X-RAY DIFFRACTION TECHNIQUES
Country/Territory	Italy
City	Frascati
Period	2/10/96 → 5/10/96

Keywords

Polycrystalline films
Synchrotron radiation
X-ray diffraction
X-ray fluorescence (glancing angle synchrotron x-ray diffraction)
synchrotron glancing angle x ray diffraction

Cite this

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title = "Glancing angle synchrotron x-ray diffraction",

abstract = "This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the x-ray region and cover reflectivity, diffraction from polycryst. films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed. Two examples of the reflectivity from multilayers and the diffraction from Fe oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the exptl. geometries that can be employed are described. A brief bibliog. is provided at the end to accompany this part of the 1996 Frascati school. [on SciFinder(R)]",

keywords = "Polycrystalline films, Synchrotron radiation, X-ray diffraction, X-ray fluorescence (glancing angle synchrotron x-ray diffraction), synchrotron glancing angle x ray diffraction",

author = "Cernik, {R J}",

note = "CAN 128:160490 Optical, Electron, and Mass Spectroscopy and Other Related Properties; THIN FILM CHARACTERISATION BY ADVANCED<br/>X-RAY DIFFRACTION TECHNIQUES ; Conference date: 02-10-1996 Through 05-10-1996",

year = "1996",

language = "English",

pages = "205--224",

}

TY - CONF

T1 - Glancing angle synchrotron x-ray diffraction

AU - Cernik, R J

N1 - CAN 128:160490 Optical, Electron, and Mass Spectroscopy and Other Related Properties

PY - 1996

Y1 - 1996

N2 - This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the x-ray region and cover reflectivity, diffraction from polycryst. films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed. Two examples of the reflectivity from multilayers and the diffraction from Fe oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the exptl. geometries that can be employed are described. A brief bibliog. is provided at the end to accompany this part of the 1996 Frascati school. [on SciFinder(R)]

AB - This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the x-ray region and cover reflectivity, diffraction from polycryst. films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed. Two examples of the reflectivity from multilayers and the diffraction from Fe oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the exptl. geometries that can be employed are described. A brief bibliog. is provided at the end to accompany this part of the 1996 Frascati school. [on SciFinder(R)]

KW - Polycrystalline films

KW - Synchrotron radiation

KW - X-ray diffraction

KW - X-ray fluorescence (glancing angle synchrotron x-ray diffraction)

KW - synchrotron glancing angle x ray diffraction

M3 - Paper

SP - 205

EP - 224

T2 - THIN FILM CHARACTERISATION BY ADVANCED<br/>X-RAY DIFFRACTION TECHNIQUES

Y2 - 2 October 1996 through 5 October 1996

ER -

Glancing angle synchrotron x-ray diffraction

Abstract

Conference

Keywords

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Cite this