Glancing angle synchrotron x-ray diffraction

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    This paper describes in basic detail some of the techniques that can be used to study thin films and surfaces. These are all in the x-ray region and cover reflectivity, diffraction from polycryst. films, textured films and single crystal films. Other effects such as fluorescence and diffuse scattering are mentioned but not discussed. Two examples of the reflectivity from multilayers and the diffraction from Fe oxide films are discussed. The advantages of the synchrotron for these studies is stressed and the exptl. geometries that can be employed are described. A brief bibliog. is provided at the end to accompany this part of the 1996 Frascati school. [on SciFinder(R)]
    Original languageEnglish
    Pages205-224
    Number of pages20
    Publication statusPublished - 1996
    EventTHIN FILM CHARACTERISATION BY ADVANCED
    X-RAY DIFFRACTION TECHNIQUES
    - Frascati, Italy
    Duration: 2 Oct 19965 Oct 1996

    Conference

    ConferenceTHIN FILM CHARACTERISATION BY ADVANCED
    X-RAY DIFFRACTION TECHNIQUES
    Country/TerritoryItaly
    CityFrascati
    Period2/10/965/10/96

    Keywords

    • Polycrystalline films
    • Synchrotron radiation
    • X-ray diffraction
    • X-ray fluorescence (glancing angle synchrotron x-ray diffraction)
    • synchrotron glancing angle x ray diffraction

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