High energy operation of the Tokyo-electron beam ion trap/present status

H Kuramoto, H Shimizu, N Nakamura, FJ Currell, D Kato, T Kinugawa, XM Tong, H Watanabe, T Fukami, S Ohtani, EJ Sokell, C Yamada, T Hirayama, K Motohashi, S Tsurubuchi, K Okazaki, M Sakurai, MR Tarbutt, JD Silver

Research output: Contribution to journalArticlepeer-review


We are using the Tokyo electron beam ion trap (Tokyo-EBIT) to study a wide range of the physics of highly charged ions. Transition wavelengths have been investigated using visible and x-ray spectroscopy. The charge-state distributions of the extracted ions from the trap are shown for the different experimental conditions. Ionization cross sections are measured by observing the time dependence of the charge state evolution in the extracted ions. A brief introduction of the recent studies is given.
Original languageEnglish
Pages (from-to)687-689
Number of pages3
JournalReview of Scientific Instruments
Issue number2
Publication statusPublished - Feb 2000

Research Beacons, Institutes and Platforms

  • Photon Science Institute
  • Dalton Nuclear Institute


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