High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy

Harry Mcdonald; Simon Rowland; Suzanne Morsch

High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy

Harry Mcdonald, Simon Rowland, Suzanne Morsch

Materials Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Accurate modelling of electrical tree growth is dependent upon a physical and chemical understanding of the insulation and degradation processes on the scale of the tree branches. While imaging techniques for the physical elements of tree growth have improved in recent years, those for the chemical regime are lagging behind. In this paper AFM-IR (Atomic Force Microscopy - Infrared Spectroscopy) is applied to a non-conducting tree channel grown in epoxy resin. This provides chemical analysis with a spatial resolution of 50 nm. The distinct chemistries from within buried channels, exposed channels and the epoxy bulk are revealed for the first time.

Original language	English
Title of host publication	2019 IEEE Electrical Insulation Conference
Publication status	Accepted/In press - 12 Jun 2019
Event	2019 Electrical Insulation Conference - Calgary, Canada Duration: 16 Jun 2019 → 19 Jun 2019

Conference

Conference	2019 Electrical Insulation Conference
Abbreviated title	EIC 2019
Country/Territory	Canada
City	Calgary
Period	16/06/19 → 19/06/19

Keywords

Electrical treeing
epoxy
AFM-IR
degradation
chemical analysis
imaging

Embargoed Document

High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy
Accepted author manuscript, 3.92 MB
Embargo ends: 1/01/29

Cite this

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title = "High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy",

abstract = "Accurate modelling of electrical tree growth is dependent upon a physical and chemical understanding of the insulation and degradation processes on the scale of the tree branches. While imaging techniques for the physical elements of tree growth have improved in recent years, those for the chemical regime are lagging behind. In this paper AFM-IR (Atomic Force Microscopy - Infrared Spectroscopy) is applied to a non-conducting tree channel grown in epoxy resin. This provides chemical analysis with a spatial resolution of 50 nm. The distinct chemistries from within buried channels, exposed channels and the epoxy bulk are revealed for the first time.",

keywords = "Electrical treeing, epoxy, AFM-IR, degradation, chemical analysis, imaging",

author = "Harry Mcdonald and Simon Rowland and Suzanne Morsch",

year = "2019",

month = jun,

day = "12",

language = "English",

booktitle = "2019 IEEE Electrical Insulation Conference",

note = "2019 Electrical Insulation Conference, EIC 2019 ; Conference date: 16-06-2019 Through 19-06-2019",

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TY - GEN

T1 - High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy

AU - Mcdonald, Harry

AU - Rowland, Simon

AU - Morsch, Suzanne

PY - 2019/6/12

Y1 - 2019/6/12

N2 - Accurate modelling of electrical tree growth is dependent upon a physical and chemical understanding of the insulation and degradation processes on the scale of the tree branches. While imaging techniques for the physical elements of tree growth have improved in recent years, those for the chemical regime are lagging behind. In this paper AFM-IR (Atomic Force Microscopy - Infrared Spectroscopy) is applied to a non-conducting tree channel grown in epoxy resin. This provides chemical analysis with a spatial resolution of 50 nm. The distinct chemistries from within buried channels, exposed channels and the epoxy bulk are revealed for the first time.

AB - Accurate modelling of electrical tree growth is dependent upon a physical and chemical understanding of the insulation and degradation processes on the scale of the tree branches. While imaging techniques for the physical elements of tree growth have improved in recent years, those for the chemical regime are lagging behind. In this paper AFM-IR (Atomic Force Microscopy - Infrared Spectroscopy) is applied to a non-conducting tree channel grown in epoxy resin. This provides chemical analysis with a spatial resolution of 50 nm. The distinct chemistries from within buried channels, exposed channels and the epoxy bulk are revealed for the first time.

KW - Electrical treeing

KW - epoxy

KW - AFM-IR

KW - degradation

KW - chemical analysis

KW - imaging

M3 - Conference contribution

BT - 2019 IEEE Electrical Insulation Conference

T2 - 2019 Electrical Insulation Conference

Y2 - 16 June 2019 through 19 June 2019

ER -

High Resolution Chemical Analysis of Electrical Trees through AFM-IR Spectroscopy

Abstract

Conference

Keywords

Embargoed Document

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Cite this