| Original language | English |
|---|---|
| Publication status | Published - 2021 |
Equipment
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Nanoscale Secondary Ion Mass Spectrometry (NanoSIMS)
Moore, K. (Academic lead) & Li, K. (Technical Specialist)
Materials EngineeringFacility/equipment: Facility
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Surface Characterisation
Spencer, B. (Platform Lead), Nikiel, M. (Technical Specialist), Sheraz, S. (Technical Specialist), Li, K. (Technical Specialist), Dwyer, L. (Technical Specialist), Wall, S. (Technical Specialist), Williams, W. (Technical Specialist), Forrest, A. (Senior Technician), Fong, J. (Senior Technician), Filip, T. (Technician), Kundu, S. (Technical Specialist), Moore, K. (Academic lead), Walton, A. (Academic lead) & Lockyer, N. (Academic lead)
FSE ResearchFacility/equipment: Platform