High-resolution transparent x-ray beam location and imaging

Roelof Van Silfhout, Anton Kachatkou, Nicholas Kyele, Peter Scott, Thierry Martin, Sergey Nikitenko

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    We present a high-resolution in situ imaging and localization method of energetic particle beams. Recording of the scattered radiation from a thin featureless foil, placed in the path of the beam, and taken with a pinhole or coded aperture camera arrangement magnifies beam movements at the sensor. At the same time, a magnified image of the beam is available with an exceptional signal-to-noise ratio. We show measurement results of the level of precision that can be achieved and compare them to theoretical limits based on the signal-to-noise levels. © 2011 Optical Society of America.
    Original languageEnglish
    Pages (from-to)570-572
    Number of pages2
    JournalOptics Letters
    Issue number4
    Publication statusPublished - 15 Feb 2011


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