High-speed device characterization using an active load-pull system and waveform engineering postulator

V. Carrubba; A. L. Clarke; S. P. Woodington; W. McGenn; M. Akmal; A. AlMuhaisen; J. Lees; S. C. Cripps; P. J. Tasker; J. Benedikt

doi:10.1109/arftg77.2011.6034553

High-speed device characterization using an active load-pull system and waveform engineering postulator

V. Carrubba, A. L. Clarke, S. P. Woodington, W. McGenn, M. Akmal, A. AlMuhaisen, J. Lees, S. C. Cripps, P. J. Tasker, J. Benedikt

EEE - Academic & Research

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or `postulate' the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to `guide' the harmonic active load-pull measurement system resulting in a very time-efficient characterization process

Original language	Undefined
Title of host publication	77th ARFTG Microwave Measurement Conference
DOIs	https://doi.org/10.1109/arftg77.2011.6034553
Publication status	Published - Jun 2011

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10.1109/arftg77.2011.6034553

Cite this

@inproceedings{eef6cad62afb41b2988b08a6201ea948,

title = "High-speed device characterization using an active load-pull system and waveform engineering postulator",

abstract = "This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or `postulate' the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to `guide' the harmonic active load-pull measurement system resulting in a very time-efficient characterization process",

author = "V. Carrubba and Clarke, {A. L.} and Woodington, {S. P.} and W. McGenn and M. Akmal and A. AlMuhaisen and J. Lees and Cripps, {S. C.} and Tasker, {P. J.} and J. Benedikt",

year = "2011",

month = jun,

doi = "10.1109/arftg77.2011.6034553",

language = "Undefined",

isbn = "9781612849591",

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T1 - High-speed device characterization using an active load-pull system and waveform engineering postulator

AU - Carrubba, V.

AU - Clarke, A. L.

AU - Woodington, S. P.

AU - McGenn, W.

AU - Akmal, M.

AU - AlMuhaisen, A.

AU - Lees, J.

AU - Cripps, S. C.

AU - Tasker, P. J.

AU - Benedikt, J.

PY - 2011/6

Y1 - 2011/6

N2 - This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or `postulate' the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to `guide' the harmonic active load-pull measurement system resulting in a very time-efficient characterization process

AB - This paper presents a methodology that provides rapid estimation of the parameters necessary for the high-speed characterization of transistor devices used in modern microwave power amplifiers. The key in achieving this significant measurement speed improvement is the use of a systematic waveform postulation methodology in combination with an active harmonic load-pull measurement system. The methodology is based on a rapid and systematic procedure that initially requires only a few DC measurement parameters to approximate the device's transfer characteristic and boundary conditions. Using these parameters, it is then possible to accurately estimate or `postulate' the idealized output current and voltage waveforms, in this case for a three harmonic Class-F mode. These waveforms are rich in information and provide harmonic load impedances as well as other key postulated parameters that can then be used to `guide' the harmonic active load-pull measurement system resulting in a very time-efficient characterization process

U2 - 10.1109/arftg77.2011.6034553

DO - 10.1109/arftg77.2011.6034553

M3 - Conference contribution

SN - 9781612849591

BT - 77th ARFTG Microwave Measurement Conference

ER -