Skip to main navigation Skip to search Skip to main content

Hot-carrier degradation characteristics and explanation in 0.25 μm PMOSFETs

  • Hong Xia Liu*
  • , Yue Hao
  • , I. D. Hawkins
  • , A. R. Peaker
    • *Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Hot-carrier degradation characteristics and explanation in 0.25 μm PMOSFETs'. Together they form a unique fingerprint.
Sort by

Engineering

Material Science