Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy

T. V. Ashworth; C. L. Pang; P. L. Wincott; D. J. Vaughan; G. Thornton

doi:10.1016/S0169-4332(02)01469-1

Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy

T. V. Ashworth, C. L. Pang, P. L. Wincott, D. J. Vaughan, G. Thornton^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

Non-contact atomic force microscopy (NC-AFM) has been used to image MgO(1 0 0) cleaved in situ under ultrahigh vacuum. The image quality was found to be dependent on the quality of the cleave, with the best images revealing an atomically flat surface with rectangular depressions one atomic layer deep. Other features observed include a line defect attributable to missing rows of Mg ²⁺ and O ^2- ions, bright features consistent with adatoms and cleave-induced damage structure. Images of rougher surfaces contained a high concentration of 'up-down' steps. These latter images are similar to tapping mode images of MgO(1 0 0) cleaved in air.

Original language	English
Pages (from-to)	2-5
Number of pages	4
Journal	Applied Surface Science
Volume	210
Issue number	1-2 SPEC.
DOIs	https://doi.org/10.1016/S0169-4332(02)01469-1
Publication status	Published - 31 Mar 2003

Keywords

Cleave
MgO
Non-contact atomic force microscopy (NC-AFM)
Ultrahigh vacuum

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10.1016/S0169-4332(02)01469-1

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title = "Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy",

abstract = " Non-contact atomic force microscopy (NC-AFM) has been used to image MgO(1 0 0) cleaved in situ under ultrahigh vacuum. The image quality was found to be dependent on the quality of the cleave, with the best images revealing an atomically flat surface with rectangular depressions one atomic layer deep. Other features observed include a line defect attributable to missing rows of Mg 2+ and O 2- ions, bright features consistent with adatoms and cleave-induced damage structure. Images of rougher surfaces contained a high concentration of 'up-down' steps. These latter images are similar to tapping mode images of MgO(1 0 0) cleaved in air.",

keywords = "Cleave, MgO, Non-contact atomic force microscopy (NC-AFM), Ultrahigh vacuum",

author = "Ashworth, {T. V.} and Pang, {C. L.} and Wincott, {P. L.} and Vaughan, {D. J.} and G. Thornton",

note = "Funding Information: This work was supported by EPSRC (UK) and an EU fifth framework grant.",

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doi = "10.1016/S0169-4332(02)01469-1",

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TY - JOUR

T1 - Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy

AU - Ashworth, T. V.

AU - Pang, C. L.

AU - Wincott, P. L.

AU - Vaughan, D. J.

AU - Thornton, G.

N1 - Funding Information: This work was supported by EPSRC (UK) and an EU fifth framework grant.

PY - 2003/3/31

Y1 - 2003/3/31

N2 - Non-contact atomic force microscopy (NC-AFM) has been used to image MgO(1 0 0) cleaved in situ under ultrahigh vacuum. The image quality was found to be dependent on the quality of the cleave, with the best images revealing an atomically flat surface with rectangular depressions one atomic layer deep. Other features observed include a line defect attributable to missing rows of Mg 2+ and O 2- ions, bright features consistent with adatoms and cleave-induced damage structure. Images of rougher surfaces contained a high concentration of 'up-down' steps. These latter images are similar to tapping mode images of MgO(1 0 0) cleaved in air.

AB - Non-contact atomic force microscopy (NC-AFM) has been used to image MgO(1 0 0) cleaved in situ under ultrahigh vacuum. The image quality was found to be dependent on the quality of the cleave, with the best images revealing an atomically flat surface with rectangular depressions one atomic layer deep. Other features observed include a line defect attributable to missing rows of Mg 2+ and O 2- ions, bright features consistent with adatoms and cleave-induced damage structure. Images of rougher surfaces contained a high concentration of 'up-down' steps. These latter images are similar to tapping mode images of MgO(1 0 0) cleaved in air.

KW - Cleave

KW - MgO

KW - Non-contact atomic force microscopy (NC-AFM)

KW - Ultrahigh vacuum

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U2 - 10.1016/S0169-4332(02)01469-1

DO - 10.1016/S0169-4332(02)01469-1

M3 - Article

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EP - 5

JO - Applied Surface Science

JF - Applied Surface Science

IS - 1-2 SPEC.

ER -

Imaging in situ cleaved MgO(1 0 0) with non-contact atomic force microscopy

Abstract

Keywords

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