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Imaging of Interlayer Coupling in van der Waals Heterostructures Using a Bright-Field Optical Microscope
Evgeny M. Alexeev*, Alessandro Catanzaro, Oleksandr V. Skrypka, Pramoda K. Nayak, Seongjoon Ahn, Sangyeon Pak, Juwon Lee, Jung Inn Sohn, Kostya S. Novoselov, Hyeon Suk Shin, Alexander I. Tartakovskii
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review