Imaging Secondary Ion Mass Spectroscopy

TY - CHAP

T1 - Imaging Secondary Ion Mass Spectroscopy

AU - Moore, K L

AU - Schröder, M

AU - Grovenor, C R M

N1 - Cited By :3 Export Date: 26 January 2015 Correspondence Address: Moore, K.L.; University of Oxford, Department of Materials, Parks Road, Oxford OX1 3PH, United Kingdom References: Vickerman, J.C.E., Brown, A.E., Reed, N.M.E., (1989) Secondary Ion Mass Spectrometry Principles and Applications, , Clarendon Press; Wilson, R.G., Stevie, F.A., Magee, C.W., (1989) Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, 1. , John Wiley & Sons, Inc., New York, (various pagings); Benninghoven, A., Reudenauer, F.G., Werner, H.W., (1987) Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, , (Chemical Analysis), John Wiley & Sons, Inc., New York; Sigmund, P., Theory of sputtering. I. Sputtering yield of amorphous and polycrystalline targets (1969) Phys. Rev, 184 (2), p. 383; http://www.cameca.com/instruments-for-research/sims-static.aspx, CAMECAGuerquin-Kern, J.L., Wu, T.D., Quintana, C., Croisy, A., Progress in analytical imaging of the cell by dynamic secondary ion mass spectrometry (SIMS microscopy) (2005) Biochim. Biophys. Acta, 1724 (3), pp. 228-238; Benninghoven, A., Beobachtung von oberflachenreaktionen mit der statischen methode der sekundarionen-massenspektroskopie (1971) I die methode. Surf. Sci, 28 (2), pp. 541-562; http://www.cameca.com/instruments-for-research/sims-dynamic.aspx, CAMECAWhitlow, H.J., Hautala, M., Sundqvist, B.U.R., Collision cascade parameters for slow particles impinging on biomolecule targets (1987) Int. J. Mass Spectrom. Ion Process., 78, pp. 329-340; Benninghoven, A., Secondary Ion Mass Spectrometry, SIMS-II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (1979) Stanford University, Stanford, California, USA, 1979, Springer Series in Chemical Physics, Vol. xiii, Springer-Verlag, Berlin, p. 298. , SIMS II; Benninghoven, A., Some aspects of secondary ion mass-spectrometry of organic-compounds (1983) Int. J. Mass Spectrom. Ion Processes, 53, pp. 85-99; Yu, M.L., Work-function dependence of negative-ion production during sputtering (1978) Phys. Rev. Lett, 40 (9), pp. 574-577; Yu, M.L., Lang, N.D., Direct evidence of electron-tunneling in the ionization of sputtered atoms (1983) Phys. Rev. Lett, 50 (2), pp. 127-130; Vickerman, J.C., Briggs, D., (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry, 9, p. 789. , SurfaceSpectra Limited, IM; SurfaceSpectra, Chichester, MA; Littmark, U., Hofer, W.O., Influence of surface-structures on sputtering - angular-distribution and yield from faceted surfaces (1978) J. Mater. Sci, 13 (12), pp. 2577-2586; Philipp, P., (2008) Applications of SIMS: Introduction - Depth Profiling I - II, , NANOBEAMS PhD School Week 2; Werner, H.W., Warmoltz, N., The influence of selective sputtering on surface composition (1976) Surf. Sci, 57 (2), pp. 706-714; Albers, T., Neumann, M., Lipinsky, D., Wiedmann, L., Benninghoven, A., Combined depth profile analysis with SNMS, SIMS and XPS - preferential sputtering and oxygen-transport in binary metal-oxide multilayer systems (1994) Surf. Interface Anal, 22 (1-12), pp. 9-13; Evans, C., http://www.eaglabs.com/training/tutorials/sims_theory_tutorial/index.phpLevi-Setti, R., Hallegot, P., Girod, C., Chabala, J.M., Li, J., Sodonis, A., Wolbach, W., Critical issues in the application of a gallium probe to high-resolution secondary ion imaging (1991) Surf. Sci, 246 (1-3), pp. 94-106; Downard, K., (2004) Mass Spectrometry: A Foundation Course, 16, p. 210. , Royal Society of Chemistry (Great Britain), Royal Society of Chemistry, Cambridge; Clode, P.L., Stern, R.A., Marshall, A.T., Subcellular imaging of isotopically labeled carbon compounds in a biological sample by ion microprobe (NanoSIMS) (2007) Microsc. Res. Tech, 70 (3), pp. 220-229; Liebl, H., Ion probe microanalysis (1975) J. Phys. E, 8 (10), pp. 797-808; van der Heide, P.A.W., Lim, M.S., Perry, S.S., Bennett, J., A systematic study of the surface roughening and sputter rate variations occurring during SIMS ultrashallow depth profile analysis of Si with Cs+ (2003) Nucl. Instrum. Methods. Phys. Res. B, 201 (2), pp. 413-425; Wittmaack, K., Sputtering yield changes, surface movement and apparent profile shifts in SIMS depth analyses of silicon using oxygen primary ions (1996) Surf. Interface Anal, 24 (6), pp. 389-398; Evans, C., http://www.eaglabs.com/files/posters/PS703.pdfRamseyer, G.O., Morrison, G.H., Relative sensitivity factors of elements in quantitative secondary ion mass-spectrometric analysis of biological reference materials (1983) Anal. Chem, 55 (12), pp. 1963-1970; Levi-Setti, R.R., Structural and microanalytical imaging of biological materials by scanning microscopy with heavy-ion probes (1988) Annu. Rev. Biophys. Biophys. Chem., 17, pp. 325-347; Vickerman, J.C., Gilmore, I.S., (2009) Surface Analysis: The Principal Techniques, 19, p. 666. , 2nd edn, John Wiley & Sons, Ltd, Chichester; Gnaser, H., Initial stages of cesium incorporation on keV-Cs+-irradiated surfaces: positive-ion emission and work-function changes (1996) Phys. Rev. B, 54 (23), pp. 17141-17146; Burns, M.S., Biological microanalysis by secondary ion mass-spectrometry - status and prospects (1988) Ultramicroscopy, 24 (2-3), pp. 269-281; Migeon, H.N., Schuhmacher, M., Slodzian, G., Analysis of insulating specimens with the Cameca Ims4f (1990) Surf. Interface Anal, 16 (1-12), pp. 9-13; Schröder, M., (2006) Flugzeit-Sekundärionenmassenspektrometrie an Thiol-self-assembly-Mmonolagen auf Gold, , PhD thesis. Physikalisches Institut, Westfälische Wilhelms-Universität, Münster; Krohn, V.E., Ringo, G.R., Ion-source of high brightness using liquid-metal (1975) Appl. Phys. Lett, 27 (9), pp. 479-481; Kollmer, F., Cluster primary ion bombardment of organic materials (2004) Appl. Surf. Sci, 231-232, pp. 153-158; Wucher, A., Molecular secondary ion formation under cluster bombardment: a fundamental review (2006) Appl. Surf. Sci, 252 (19), pp. 6482-6489; Brunelle, A., Laprevote, O., Lipid imaging with cluster time-of-flight secondary ion mass spectrometry (2009) Anal. Bioanal. Chem, 393 (1), pp. 31-35; Alikhanov, S.G., A new impulse technique for ion mass measurements (1957) Sov. Phys. JETP-USSR, 4 (3), pp. 452-453; Slodzian, G., Daigne, B., Girard, F., Boust, F., Hillion, F., Scanning secondary ion analytical microscopy with parallel detection (1992) Biol. Cell, 74 (1), pp. 43-50; Instrumentation booklet, , http://www.cameca.fr/doc_en_pdf/ns50_instrumentation_booklet.pdf, CAMECA; Stadermann, F.J., http://www.nrims.hms.harvard.edu/slides/Stadermann.pdfNewbury, D.E., (1986) Advanced Scanninge electron Microscopy and X-ray Microanalysis, 12, p. 454. , Plenum, New York, London; Evans, C., http://www.eaglabs.com/techniques/analytical_techniques/gdms.phpLombi, E., Scheckel, K.G., Kempson, I.M., In situ analysis of metal(loid)s in plants: state of the art and artefacts (2011) Environ. Exp. Bot, 72 (1), pp. 3-17; Lombi, E., Scheckel, K.G., Pallon, J., Carey, A.M., Zhu, Y.G., Meharg, A.A., Speciation and distribution of arsenic and localization of nutrients in rice grains (2009) New Phytol, 184 (1), pp. 193-201; Lozano-Perez, S., Schroder, M., Yamada, T., Terachi, T., English, C.A., Grovenor, C.R.M., Using NanoSIMS to map trace elements in stainless steels from nuclear reactors (2008) Appl. Surf. Sci, 255 (4), pp. 1541-1543; Jolliffe, I.T., (2002) Principal Component Analysis, , vol. xxix, 2nd edn, Springer, New York, London, 487 p; Larsen, R., Decomposition using maximum autocorrelation factors (2002) J. Chemom, 16 (8-10), pp. 427-435; Tyler, B.J., Multivariate statistical image processing for molecular specific imaging in organic and bio-systems (2006) Appl. Surf. Sci, 252 (19), pp. 6875-6882; Breitenstein, D., Rommel, C.E., Mollers, R., Wegener, J., Hagenhoff, B., The chemical composition of animal cells and their intracellular compartments reconstructed from 3D mass spectrometry (2007) Angew. Chem. Int. Ed, 46 (28), pp. 5332-5335; Breitenstein, D., Rommel, C.E., Stolwijk, J., Wegener, J., Hagenhoff, B., The chemical composition of animal cells reconstructed from 2D and 3D ToF-SIMS analysis (2008) Appl. Surf. Sci, 255 (4), pp. 1249-1256; Möller, J., (2008) Analysen kryopr äparierter nicht-dehydrierter Probensysteme mit Hilfe eines neu entwickelten ToF-SIMS-Instruments mit integrierter Hochvakuumkryoschnittapparatur, , PhD thesis. Physikalisches Institut, Westfälische Wilhelms-Universität, Münster; Fragu, P., Briancon, C., Fourre, C., Clerc, J., Casiraghi, O., Jeusset, J., Omri, F., Halpern, S., Sims microscopy in the biomedical field (1992) Biol. Cell, 74 (1), pp. 5-18; Heeren, R.M.A., McDonnell, L.A., Amstalden, E., Luxembourg, S.L., Altelaar, A.F.M., Piersma, S.R., Why don't biologists use SIMS? A critical evaluation of imaging MS (2006) Appl. Surf. Sci, 252 (19), pp. 6827-6835; Burns, M.S., Applications of secondary ion mass-spectrometry (SIMS) in biological-research - a review (1982) J. Microsc, 127, pp. 237-258. , Oxford; Chandra, S., Smith, D.R., Morrison, G.H., Subcellular imaging by dynamic SIMS ion microscopy (2000) Anal. Chem, 72 (3), pp. 104a-114a; Galle, P., Sur une nouvelle methode d'analyse cellulaire utilisant le phenomene d'emission ioniqe secondaire (1970) Ann. Phys., Biol. Med, 42, p. 83; Grignon, N., Halpern, S., Gojon, A., Fragu, P., N-14 and N-15 imaging by SIMS microscopy in soybean leaves (1992) Biol. Cell, 74 (1), pp. 143-146; Moore, K.L., Schroder, M., Lombi, E., Zhao, F.J., McGrath, S.P., Hawkesford, M.J., Shewry, P.R., Grovenor, C.R.M., NanoSIMS analysis of arsenic and selenium in cereal grain (2010) New Phytol, 185 (2), pp. 434-445; Clode, P.L., Kilburn, M.R., Jones, D.L., Stockdale, E.A., Cliff, J.B., Herrmann, A.M., Murphy, D.V., In situ mapping of nutrient uptake in the rhizosphere using nanoscale secondary ion mass spectrometry (2009) Plant Physiol, 151 (4), pp. 1751-1757; Behrens, S., Losekann, T., Pett-Ridge, J., Weber, P.K., Ng, W.O., Stevenson, B.S., Hutcheon, I.D., Spormann, A.M., Linking microbial phylogeny to metabolic activity at the single-cell level by using enhanced element labeling-catalyzed reporter deposition fluorescence in situ hybridization (EL-FISH) and NanoSIMS (2008) Appl. Environ. Microbiol, 74 (10), pp. 3143-3150; Lechene, C., Hillion, F., McMahon, G., Benson, D., Kleinfeld, A., Kampf, J.P., Distel, D., Slodzian, G., High-resolution quantitative imaging of mammalian and bacterial cells using stable isotope mass spectrometry (2006) J. Biol, 5 (6), p. 20; Cooke, R., Kuntz, I.D., Properties of water in biological-systems (1974) Ann. Rev. Biophys. Bioeng., 3, pp. 95-126; Mentre, P., Preservation of the diffusible cations for SIMS microscopy. I. A problem related to the state of water in the cell (1992) Biol. Cell, 74 (1), pp. 19-30; Chandra, S., Morrison, G.H., Imaging ion and molecular-transport at subcellular resolution by secondary-ion mass-spectrometry (1995) Int. J. Mass Spectrom. Ion Process., 143, pp. 161-176; Hayat, M.A., (2000) Principles and Techniques of Electron Microscopy: Biological Applications, , vol. xix, 4th edn, Cambridge University Press, Cambridge, 543 p; Chandra, S., Morrison, G.H., Sample preparation of animal-tissues and cell-cultures for secondary ion mass-spectrometry (SIMS) microscopy (1992) Biol. Cell, 74 (1), pp. 31-42; Stika, K.M., Bielat, K.L., Morrison, G.H., Diffusible ion localization by ion microscopy - a comparison of chemically prepared and fast-frozen, freeze-dried, unfixed liver sections (1980) J. Microsc, 118, pp. 409-420. , Oxford; Lau, K.H., Christlieb, M., Schröder, M., Sheldon, H., Harris, A.L., Grovenor, C.R.M., Development of a new bimodal imaging methodology; a combination of fluorescence microscopy and high resolution secondary ion mass spectrometry (2010) J. Microsc, 240 (1), pp. 21-31; Dahl, R., Staehelin, L.A., High-pressure freezing for the preservation of biological structure - theory and practice (1989) J. Electron Microsc. Tech, 13 (3), pp. 165-174; Steinbrecht, R.A., Zierold, K., (1987) Cryotechniques in Biological Eelectron Microscopy, , vol. xvii, Springer-Verlag, Berlin, London, 297 p; Studer, D., Graber, W., Al-Amoudi, A., Eggli, P., A new approach for cryofixation by high-pressure freezing (2001) J. Microsc, 203, pp. 285-294. , Oxford; McDonald, K.L., Auer, M., High-pressure freezing, cellular tomography, and structural cell biology (2006) Biotechniques, 41 (2), pp. 137-143; Hajibagheri, M.A., Flowers, T.J., Use of freeze-substitution and molecular distillation drying in the preparation of Dunaliella-Parva for ion localization studies by X-ray-microanalysis (1993) Microsc. Res. Tech, 24 (5), pp. 395-399; Giddings, T.H., Staehelin, L.A., Ribosome binding-sites visualized on freeze-fractured membranes of the rough endoplasmic-reticulum (1980) J. Cell Biol, 85 (1), pp. 147-152; Livesey, S.A., Linner, J.G., Cryofixation taking on a new look (1987) Nature, 327 (6119), pp. 255-256; Kellenberger, E., The potential of cryofixation and freeze substitution - observations and theoretical considerations (1991) J. Microsc, 161, pp. 183-203. , Oxford; Huang, C.X., Canny, M.J., Oates, K., Mccully, M.E., Planing frozen-hydrated plant specimens for SEM observation and EDX microanalysis (1994) Microsc. Res. Tech, 28 (1), pp. 67-74; Chandra, S., Challenges of biological sample preparation for SIMS imaging of elements and molecules at subcellular resolution (2008) Appl. Surf. Sci, 255 (4), pp. 1273-1284; Chandra, S., Bernius, M.T., Morrison, G.H., Proceedings of the Fifth International Conference on Secondary Ion Mass Spectrometry: SIMS V (1986) Springer-Verlag, Berlin, p. 429. , eds A. Benninghoven, R.J. Colton, and D.Simons; Derue, C., Gibouin, D., Lefebvre, F., Studer, D., Thellier, M., Ripoll, C., Relative sensitivity factors of inorganic cations in frozen-hydrated standards in secondary ion MS analysis (2006) Anal. Chem, 78 (8), pp. 2471-2477; Metzner, R., Schneider, H.U., Breuer, U., Schroeder, W.H., Imaging nutrient distributions in plant tissue using time-of-flight secondary ion mass spectrometry and scanning electron microscopy (2008) Plant Physiol, 147 (4), pp. 1774-1787; Smart, K.E., Smith, J.A.C., Kilburn, M.R., Martin, B.G.H., Hawes, C., Grovenor, C.R.M., High-resolution elemental localization in vacuolate plant cells by nanoscale secondary ion mass spectrometry (2010) Plant J, 63 (5), pp. 870-879; Sparks, J.P., Chandra, S., Derry, L.A., Parthasarathy, M.V., Daugherty, C.S., Griffin, R., Subcellular localization of silicon and germanium in grass root and leaf tissues by SIMS: evidence for differential and active transport (2011) Biogeochemistry, 104, pp. 237-249; Derue, C., Gibouin, D., Demarty, M., Verdus, M.C., Lefebvre, F., Thellier, M., Ripoll, C., Dynamic-SIMS imaging and quantification of inorganic ions in frozen-hydrated plant samples (2006) Microsc. Res. Tech, 69 (1), pp. 53-63

PY - 2012

Y1 - 2012

KW - Matrix effect

KW - SIMS

KW - Sputter yield

KW - Sputtering

KW - Static limit

KW - Transient

U2 - 10.1002/9783527641864.ch21

DO - 10.1002/9783527641864.ch21

M3 - Chapter

SN - 9783527317066 (ISBN)

VL - 2

SP - 709

EP - 744

BT - Handbook of Nanoscopy

PB - John Wiley & Sons Ltd

ER -