Imaging the active surfaces of cerium dioxide nanoparticles

Sarah J. Haigh; Neil P. Young; Hidetaka Sawada; Kunio Takayanagi; Angus I. Kirkland

doi:10.1002/cphc.201100376

Imaging the active surfaces of cerium dioxide nanoparticles

Sarah J. Haigh, Neil P. Young, Hidetaka Sawada, Kunio Takayanagi, Angus I. Kirkland

Research output: Contribution to journal › Article › peer-review

Abstract

Watching the changes: Aberration-corrected transmission electron microscopy is used to image CeO2 nanoparticles during an electron-beam-induced structure transformation. Analysis of the phase of the computationally restored exit wavefunction (see Figure, a) allows the nature of the different surfaces (b) to be characterized for the first time and provides direct experimental verification of previously reported theoretical surface structure calculations. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English
Pages (from-to)	2397-2399
Number of pages	2
Journal	ChemPhysChem
Volume	12
Issue number	13
DOIs	https://doi.org/10.1002/cphc.201100376
Publication status	Published - 12 Sept 2011

Keywords

catalysis
electron microscopy
nanoparticles
oxides
surface analysis

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http://dx.doi.org/10.1002/cphc.201100376

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title = "Imaging the active surfaces of cerium dioxide nanoparticles",

abstract = "Watching the changes: Aberration-corrected transmission electron microscopy is used to image CeO2 nanoparticles during an electron-beam-induced structure transformation. Analysis of the phase of the computationally restored exit wavefunction (see Figure, a) allows the nature of the different surfaces (b) to be characterized for the first time and provides direct experimental verification of previously reported theoretical surface structure calculations. Copyright {\textcopyright} 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.",

keywords = "catalysis, electron microscopy, nanoparticles, oxides, surface analysis",

author = "Haigh, {Sarah J.} and Young, {Neil P.} and Hidetaka Sawada and Kunio Takayanagi and Kirkland, {Angus I.}",

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AU - Young, Neil P.

AU - Sawada, Hidetaka

AU - Takayanagi, Kunio

AU - Kirkland, Angus I.

PY - 2011/9/12

Y1 - 2011/9/12

N2 - Watching the changes: Aberration-corrected transmission electron microscopy is used to image CeO2 nanoparticles during an electron-beam-induced structure transformation. Analysis of the phase of the computationally restored exit wavefunction (see Figure, a) allows the nature of the different surfaces (b) to be characterized for the first time and provides direct experimental verification of previously reported theoretical surface structure calculations. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

AB - Watching the changes: Aberration-corrected transmission electron microscopy is used to image CeO2 nanoparticles during an electron-beam-induced structure transformation. Analysis of the phase of the computationally restored exit wavefunction (see Figure, a) allows the nature of the different surfaces (b) to be characterized for the first time and provides direct experimental verification of previously reported theoretical surface structure calculations. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

KW - catalysis

KW - electron microscopy

KW - nanoparticles

KW - oxides

KW - surface analysis

U2 - 10.1002/cphc.201100376

DO - 10.1002/cphc.201100376

M3 - Article

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JO - ChemPhysChem

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Imaging the active surfaces of cerium dioxide nanoparticles

Abstract

Keywords

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