Implementing the grayscale wave metric on a cellular array processor chip

Dániel Hillier; Piotr Dudek

doi:10.1109/CNNA.2008.4588662

Implementing the grayscale wave metric on a cellular array processor chip

Dániel Hillier, Piotr Dudek

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Abstract

Algorithms designed for machine vision applications such as medical imaging, surveillance, etc., very often require some kind of comparison between images. The non-linear wave metric can measure both the shape and the area difference between two objects in one single operation. We present the implementation of the wave metric on the SCAMP chip that combines the benefits of a highly selective metric with high speed, efficient execution. ©2008 IEEE.

Original language	English
Title of host publication	Proceedings of the IEEE International Workshop on Cellular Neural Networks and their Applications\|Proc IEEE Int Workshop Cell Neural Networks Appl
Pages	120-124
Number of pages	4
DOIs	https://doi.org/10.1109/CNNA.2008.4588662
Publication status	Published - 2008
Event	2008 11th International Workshop on Cellular Neural Networks and their Applications, CNNA 2008, Cellular Nano-scale Architectures - Santiago de Compostela Duration: 1 Jul 2008 → …

Conference

Conference	2008 11th International Workshop on Cellular Neural Networks and their Applications, CNNA 2008, Cellular Nano-scale Architectures
City	Santiago de Compostela
Period	1/07/08 → …

Keywords

Cellular nonlinear networks
SCAMP
Wave computing
Wave metric

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10.1109/CNNA.2008.4588662

Cite this

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title = "Implementing the grayscale wave metric on a cellular array processor chip",

abstract = "Algorithms designed for machine vision applications such as medical imaging, surveillance, etc., very often require some kind of comparison between images. The non-linear wave metric can measure both the shape and the area difference between two objects in one single operation. We present the implementation of the wave metric on the SCAMP chip that combines the benefits of a highly selective metric with high speed, efficient execution. {\textcopyright}2008 IEEE.",

keywords = "Cellular nonlinear networks, SCAMP, Wave computing, Wave metric",

author = "D{\'a}niel Hillier and Piotr Dudek",

year = "2008",

doi = "10.1109/CNNA.2008.4588662",

language = "English",

isbn = "9781424420902",

pages = "120--124",

booktitle = "Proceedings of the IEEE International Workshop on Cellular Neural Networks and their Applications|Proc IEEE Int Workshop Cell Neural Networks Appl",

note = "2008 11th International Workshop on Cellular Neural Networks and their Applications, CNNA 2008, Cellular Nano-scale Architectures ; Conference date: 01-07-2008",

}

Hillier, D & Dudek, P 2008, Implementing the grayscale wave metric on a cellular array processor chip. in Proceedings of the IEEE International Workshop on Cellular Neural Networks and their Applications|Proc IEEE Int Workshop Cell Neural Networks Appl. pp. 120-124, 2008 11th International Workshop on Cellular Neural Networks and their Applications, CNNA 2008, Cellular Nano-scale Architectures, Santiago de Compostela, 1/07/08. https://doi.org/10.1109/CNNA.2008.4588662

Implementing the grayscale wave metric on a cellular array processor chip. / Hillier, Dániel; Dudek, Piotr.
Proceedings of the IEEE International Workshop on Cellular Neural Networks and their Applications|Proc IEEE Int Workshop Cell Neural Networks Appl. 2008. p. 120-124.

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

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AB - Algorithms designed for machine vision applications such as medical imaging, surveillance, etc., very often require some kind of comparison between images. The non-linear wave metric can measure both the shape and the area difference between two objects in one single operation. We present the implementation of the wave metric on the SCAMP chip that combines the benefits of a highly selective metric with high speed, efficient execution. ©2008 IEEE.

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KW - SCAMP

KW - Wave computing

KW - Wave metric

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M3 - Conference contribution

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BT - Proceedings of the IEEE International Workshop on Cellular Neural Networks and their Applications|Proc IEEE Int Workshop Cell Neural Networks Appl

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ER -

Implementing the grayscale wave metric on a cellular array processor chip

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Keywords

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