In Situ Characterization of Alloy Catalysts for Low-Temperature Graphene Growth

Robert S. Weatherup, Bernhard C. Bayer, Raoul Blume, Caterina Ducati, Carsten Baehtz, Robert Schloegl, Stephan Hofmann

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Low-temperature (∼450 °C), scalable chemical vapor deposition of predominantly monolayer (74%) graphene films with an average D/G peak ratio of 0.24 and domain sizes in excess of 220 μm2 is demonstrated via the design of alloy catalysts. The admixture of Au to polycrystalline Ni allows a controlled decrease in graphene nucleation density, highlighting the role of step edges. In situ, time-, and depth-resolved X-ray photoelectron spectroscopy and X-ray diffraction reveal the role of subsurface C species and allow a coherent model for graphene formation to be devised.
    Original languageEnglish
    Pages (from-to)4154-4160
    JournalNano Letters
    Volume11
    Issue number10
    DOIs
    Publication statusPublished - 9 Sept 2011

    Keywords

    • Graphene
    • chemical vapor deposition (CVD)
    • alloy catalyst
    • in situ metrology
    • XPS
    • XRD

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