In Situ Characterization of Interfaces between Liquid Tin-Vanadium Alloys and Alumina by Neutron Reflection Spectroscopy

Andrew J. Winn; Brian Derby; John R P Webster; Stephen Holt

doi:10.1111/j.1551-2916.2004.00279.x

In Situ Characterization of Interfaces between Liquid Tin-Vanadium Alloys and Alumina by Neutron Reflection Spectroscopy

Andrew J. Winn, Brian Derby, John R P Webster, Stephen Holt

Research output: Contribution to journal › Article › peer-review

Abstract

The composition and structure of interfaces between single crystal Al 2O3 (sapphire) samples and liquid Sn-V alloys, containing 1% and 3% V, have been characterized in situ at high temperature using neutron reflection spectroscopy. Measurements made at 900°C are shown to be consistent with a thin (10-25 nm) AlV2O4 layer forming at the solid/liquid interface, with possibly a thinner layer of enhanced V content adjacent to the liquid, to promote wetting. After longer time exposure to temperature this interface layer roughens and a more complex interface structure occurs.

Original language	English
Pages (from-to)	279-285
Number of pages	6
Journal	Journal of the American Ceramic Society
Volume	87
Issue number	2
DOIs	https://doi.org/10.1111/j.1551-2916.2004.00279.x
Publication status	Published - Feb 2004

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title = "In Situ Characterization of Interfaces between Liquid Tin-Vanadium Alloys and Alumina by Neutron Reflection Spectroscopy",

abstract = "The composition and structure of interfaces between single crystal Al 2O3 (sapphire) samples and liquid Sn-V alloys, containing 1% and 3% V, have been characterized in situ at high temperature using neutron reflection spectroscopy. Measurements made at 900°C are shown to be consistent with a thin (10-25 nm) AlV2O4 layer forming at the solid/liquid interface, with possibly a thinner layer of enhanced V content adjacent to the liquid, to promote wetting. After longer time exposure to temperature this interface layer roughens and a more complex interface structure occurs.",

author = "Winn, {Andrew J.} and Brian Derby and Webster, {John R P} and Stephen Holt",

year = "2004",

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AU - Webster, John R P

AU - Holt, Stephen

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N2 - The composition and structure of interfaces between single crystal Al 2O3 (sapphire) samples and liquid Sn-V alloys, containing 1% and 3% V, have been characterized in situ at high temperature using neutron reflection spectroscopy. Measurements made at 900°C are shown to be consistent with a thin (10-25 nm) AlV2O4 layer forming at the solid/liquid interface, with possibly a thinner layer of enhanced V content adjacent to the liquid, to promote wetting. After longer time exposure to temperature this interface layer roughens and a more complex interface structure occurs.

AB - The composition and structure of interfaces between single crystal Al 2O3 (sapphire) samples and liquid Sn-V alloys, containing 1% and 3% V, have been characterized in situ at high temperature using neutron reflection spectroscopy. Measurements made at 900°C are shown to be consistent with a thin (10-25 nm) AlV2O4 layer forming at the solid/liquid interface, with possibly a thinner layer of enhanced V content adjacent to the liquid, to promote wetting. After longer time exposure to temperature this interface layer roughens and a more complex interface structure occurs.

U2 - 10.1111/j.1551-2916.2004.00279.x

DO - 10.1111/j.1551-2916.2004.00279.x

M3 - Article

SN - 0002-7820

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EP - 285

JO - Journal of the American Ceramic Society

JF - Journal of the American Ceramic Society

IS - 2

ER -

In Situ Characterization of Interfaces between Liquid Tin-Vanadium Alloys and Alumina by Neutron Reflection Spectroscopy

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