In-situ electrical measurements of vertically aligned nanostructures

G. McMahon, T. Paudel, Z. F. Ren, M. J. Naughton

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	708-709
Journal	Microscopy and Microanalysis
Volume	15
Issue number	(Suppl 2)
DOIs	https://doi.org/10.1017/S1431927609097256
Publication status	Published - Jul 2009

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title = "In-situ electrical measurements of vertically aligned nanostructures",

author = "G. McMahon and T. Paudel and Ren, {Z. F.} and Naughton, {M. J.}",

year = "2009",

month = jul,

doi = "10.1017/S1431927609097256",

language = "English",

volume = "15",

pages = "708--709",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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}

TY - JOUR

T1 - In-situ electrical measurements of vertically aligned nanostructures

AU - McMahon, G.

AU - Paudel, T.

AU - Ren, Z. F.

AU - Naughton, M. J.

PY - 2009/7

Y1 - 2009/7

U2 - 10.1017/S1431927609097256

DO - 10.1017/S1431927609097256

M3 - Article

SN - 1431-9276

VL - 15

SP - 708

EP - 709

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - (Suppl 2)

ER -