Inelastic background modelling applied to Hard X-ray Photoelectron Spectroscopy of deeply buried layers: a comparison of synchrotron and lab-based (9.25 keV) measurements

Ben Spencer, Suresh Maniyarasu, B Reed, D J H Cant, Ruben Ahumada Lazo, Andrew Thomas, Christopher Muryn, M Maschek, S K Eriksson, T Wiell, T L Lee, S Tougaard, G Shard, Wendy Flavell

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