Influence of carrier-free surface layers on infrared reflectance spectra of n-type metallic oxides

P. A. Cox; E. G. Egdell; W. R. Flavell; J. P. Kemp; F. H. Potter; C. S. Rastomjee

Influence of carrier-free surface layers on infrared reflectance spectra of n-type metallic oxides

P. A. Cox, E. G. Egdell, W. R. Flavell, J. P. Kemp, F. H. Potter, C. S. Rastomjee

Research output: Contribution to journal › Article › peer-review

Abstract

The influence of carrier-free surface layers on infrared reflection spectra of metallic oxides has been explored using model calculations on two-layer systems. Reflectivity minima are found at LO phonon frequencies. Comparison is made with preliminary experimental data from Sb-doped SnO2 ceramics and Na0.6WO3 single crystal surfaces oxidised in air at 500°C. © 1990.

Original language	English
Pages (from-to)	1173-1182
Number of pages	9
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	54-55
Issue number	C
Publication status	Published - 1990

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title = "Influence of carrier-free surface layers on infrared reflectance spectra of n-type metallic oxides",

abstract = "The influence of carrier-free surface layers on infrared reflection spectra of metallic oxides has been explored using model calculations on two-layer systems. Reflectivity minima are found at LO phonon frequencies. Comparison is made with preliminary experimental data from Sb-doped SnO2 ceramics and Na0.6WO3 single crystal surfaces oxidised in air at 500°C. {\textcopyright} 1990.",

author = "Cox, {P. A.} and Egdell, {E. G.} and Flavell, {W. R.} and Kemp, {J. P.} and Potter, {F. H.} and Rastomjee, {C. S.}",

year = "1990",

language = "English",

volume = "54-55",

pages = "1173--1182",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

publisher = "Elsevier BV",

number = "C",

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TY - JOUR

T1 - Influence of carrier-free surface layers on infrared reflectance spectra of n-type metallic oxides

AU - Cox, P. A.

AU - Egdell, E. G.

AU - Flavell, W. R.

AU - Kemp, J. P.

AU - Potter, F. H.

AU - Rastomjee, C. S.

PY - 1990

Y1 - 1990

N2 - The influence of carrier-free surface layers on infrared reflection spectra of metallic oxides has been explored using model calculations on two-layer systems. Reflectivity minima are found at LO phonon frequencies. Comparison is made with preliminary experimental data from Sb-doped SnO2 ceramics and Na0.6WO3 single crystal surfaces oxidised in air at 500°C. © 1990.

AB - The influence of carrier-free surface layers on infrared reflection spectra of metallic oxides has been explored using model calculations on two-layer systems. Reflectivity minima are found at LO phonon frequencies. Comparison is made with preliminary experimental data from Sb-doped SnO2 ceramics and Na0.6WO3 single crystal surfaces oxidised in air at 500°C. © 1990.

M3 - Article

VL - 54-55

SP - 1173

EP - 1182

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

IS - C

ER -

Influence of carrier-free surface layers on infrared reflectance spectra of n-type metallic oxides

Abstract

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