Injection of metallic elements into an electron-beam ion trap using a Knudsen cell

C Yamada, K Nagata, N Nakamura, S Ohtani, S Takahashi, T Tobiyama, M Tona, H Watanabe, N Yoshiyasu, M Sakurai, FJ Currell

Research output: Contribution to journalArticlepeer-review

Abstract

A method of injecting metallic elements into an electron-beam ion trap (EBIT) is described. The method is advantageous over the conventional coaxial and pulsed injection methods in two ways: (a) complicated switching of injection and extraction beams can be avoided when extracting beams of highly charged ions from the EBIT and (b) a beam of stable intensity can be achieved. This method may be applicable to any metallic elements or metallic compounds that have vapor pressures of ∼0.1Pa at a temperature lower than 1900°C. We have employed this method for the extraction of highly charged ions of Bi, Er, Fe, and Ho.
Original languageEnglish
Number of pages3
JournalReview of Scientific Instruments
Volume77
Issue number6
DOIs
Publication statusPublished - Jun 2006

Research Beacons, Institutes and Platforms

  • Dalton Nuclear Institute

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