Abstract
A method of injecting metallic elements into an electron-beam ion trap (EBIT) is described. The method is advantageous over the conventional coaxial and pulsed injection methods in two ways: (a) complicated switching of injection and extraction beams can be avoided when extracting beams of highly charged ions from the EBIT and (b) a beam of stable intensity can be achieved. This method may be applicable to any metallic elements or metallic compounds that have vapor pressures of ∼0.1Pa at a temperature lower than 1900°C. We have employed this method for the extraction of highly charged ions of Bi, Er, Fe, and Ho.
Original language | English |
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Number of pages | 3 |
Journal | Review of Scientific Instruments |
Volume | 77 |
Issue number | 6 |
DOIs | |
Publication status | Published - Jun 2006 |
Research Beacons, Institutes and Platforms
- Dalton Nuclear Institute