Interconnect delay minimization through interlayer via placement in 3-D ICs

Vasilis F. Pavlidis*, Eby G. Friedman

*Corresponding author for this work

    Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

    Abstract

    The dependence of the propagation delay of the interlay er 3-D interconnects on the vertical through via location and length is investigated. For a variable vertical through via location, with fixed vertical length, the optimum vertical through via location that minimizes the propagation delay of an interconnect line connecting two circuits on different planes is determined. The optimum vertical through via location and length or, equivalently, the number of physical planes traversed by the vertical through via, are determined for varying the placement of the connected circuits. Design expressions for the optimal via locations and lengths have been developed to support placement and routing algorithms for 3-D ICs.

    Original languageEnglish
    Title of host publicationGLSVSI'05 - Proceedings of the 2005 ACM Great
    Pages20-25
    Number of pages6
    Publication statusPublished - 2005
    Event2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05 - Chicago, IL, United States
    Duration: 17 Apr 200519 Apr 2005

    Conference

    Conference2005 ACM Great Lakessymposium on VLSI, GLSVLSI'05
    Country/TerritoryUnited States
    CityChicago, IL
    Period17/04/0519/04/05

    Keywords

    • 3-D ICs
    • Elmore delay
    • RC Interconnects

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