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Abstract
For the electromagnetic eddy current testing, various methods have been proposed for reducing the lift-off error on the measurement of samples. In this paper, instead of eliminating the measurement error caused by the lift-off effect, an algorithm has been proposed to directly measure the lift-off distance between the sensor and non-magnetic conductive plates. The algorithm is based on a sample-independent inductance (SII) feature. That is, under high working frequencies, the inductance is found sensitive to the lift-off distance and independent of the test piece under an optimal single high working frequency (43.87 kHz). Furthermore, the predicted lift-off distance is used for the thickness prediction of the non-magnetic conductive samples using an iterative method. Considering the eddy current skin depth, the thickness prediction is operated under a single lower frequency (0.20 kHz). As the inductance has different sensitivities to the lift-off and thickness, the prediction error of the sample thickness is different from that of the lift-off distance. From the experiments on three different nonmagnetic samples – aluminium, copper, and brass, the maximum prediction error of the lift-off distance and sample thickness is 1.1 mm and 5.42 % respectively at the lift-off of 12.0 mm.
Original language | English |
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Journal | IEEE Transactions on Instrumentation and Measurement |
DOIs | |
Publication status | Published - 24 Nov 2020 |
Keywords
- Eddy current sensor
- lift-off measurement
- non-destructive testing
- sample-independence
- thickness measurement
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Dive into the research topics of 'Inversion of lift-off distance and thickness for non-magnetic metal using eddy current testing'. Together they form a unique fingerprint.Projects
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Electromagnetic Sensing Group
Peyton, A. (PI), Fletcher, A. (Researcher), Daniels, D. (CoI), Conniffe, D. (PGR student), Podd, F. (PI), Davidson, J. (Researcher), Anderson, J. (Support team), Wilson, J. (Researcher), Marsh, L. (PI), O'Toole, M. (PI), Watson, S. (PGR student), Yin, W. (PI), Regan, A. (PGR student), Williams, K. (Researcher), Rana, S. (Researcher), Khalil, K. (PGR student), Hills, D. (PGR student), Whyte, C. (PGR student), Wang, C. (PGR student), Hodgskin-Brown, R. (PGR student), Dadkhahtehrani, F. (PGR student), Forster, S. (PGR student), Zhu, F. (PGR student), Yu, K. (PGR student), Xiong, L. (PGR student), Lu, T. (PGR student), Zhang, L. (PGR student), Lyu, R. (PGR student), Zhu, R. (PGR student), She, S. (PGR student), Meng, T. (PGR student), Pang, X. (PGR student), Zheng, X. (PGR student), Bai, X. (PGR student), Zou, X. (PGR student), Ding, Y. (PGR student), Shao, Y. (PGR student), Xia, Z. (PGR student), Zhang, Z. (PGR student), Khangerey, R. (PGR student) & Lawless, B. (Researcher)
1/10/04 → …
Project: Research