Investigation of the thermal charge “trapping-detrapping” in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

Masashi Ishii; Iain F Crowe; Matthew P Halsall; Andrew P Knights; Russell M Gwilliam; Bruce Hamilton

doi:10.1063/1.4772475

Investigation of the thermal charge “trapping-detrapping” in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

Masashi Ishii, Iain F Crowe, Matthew P Halsall, Andrew P Knights, Russell M Gwilliam, Bruce Hamilton

Research output: Contribution to journal › Article › peer-review

Abstract

The charge confinement in silicon nanocrystals over the temperature range 35–300 K was investigated by complex impedance spectroscopy (CIS). A charge response found in the “dark” (i.e., no laser pumping) CIS spectrum indicated a frequency shift with temperature, which was well correlated with the temperature dependent photoluminescence (PL) intensity. From equivalent circuit analyses of this frequency shift, we were able to determine the charge “trapping-detrapping” mechanism giving rise to the luminescence. We find that the luminescence decay transient, expressed as a stretched exponential function, can be mathematically converted to a CIS spectrum.

Original language	English
Journal	Applied Physics Letters
Volume	101
DOIs	https://doi.org/10.1063/1.4772475
Publication status	Published - 13 Dec 2012

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1063/1.4772475

Cite this

@article{66d0773d40b1437eb0072777bb067a1f,

title = "Investigation of the thermal charge “trapping-detrapping” in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra",

abstract = "The charge confinement in silicon nanocrystals over the temperature range 35–300 K was investigated by complex impedance spectroscopy (CIS). A charge response found in the “dark” (i.e., no laser pumping) CIS spectrum indicated a frequency shift with temperature, which was well correlated with the temperature dependent photoluminescence (PL) intensity. From equivalent circuit analyses of this frequency shift, we were able to determine the charge “trapping-detrapping” mechanism giving rise to the luminescence. We find that the luminescence decay transient, expressed as a stretched exponential function, can be mathematically converted to a CIS spectrum.",

author = "Masashi Ishii and Crowe, {Iain F} and Halsall, {Matthew P} and Knights, {Andrew P} and Gwilliam, {Russell M} and Bruce Hamilton",

year = "2012",

month = dec,

day = "13",

doi = "10.1063/1.4772475",

language = "English",

volume = "101",

journal = "Applied Physics Letters",

publisher = "American Institute of Physics",

}

TY - JOUR

T1 - Investigation of the thermal charge “trapping-detrapping” in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

AU - Ishii, Masashi

AU - Crowe, Iain F

AU - Halsall, Matthew P

AU - Knights, Andrew P

AU - Gwilliam, Russell M

AU - Hamilton, Bruce

PY - 2012/12/13

Y1 - 2012/12/13

N2 - The charge confinement in silicon nanocrystals over the temperature range 35–300 K was investigated by complex impedance spectroscopy (CIS). A charge response found in the “dark” (i.e., no laser pumping) CIS spectrum indicated a frequency shift with temperature, which was well correlated with the temperature dependent photoluminescence (PL) intensity. From equivalent circuit analyses of this frequency shift, we were able to determine the charge “trapping-detrapping” mechanism giving rise to the luminescence. We find that the luminescence decay transient, expressed as a stretched exponential function, can be mathematically converted to a CIS spectrum.

AB - The charge confinement in silicon nanocrystals over the temperature range 35–300 K was investigated by complex impedance spectroscopy (CIS). A charge response found in the “dark” (i.e., no laser pumping) CIS spectrum indicated a frequency shift with temperature, which was well correlated with the temperature dependent photoluminescence (PL) intensity. From equivalent circuit analyses of this frequency shift, we were able to determine the charge “trapping-detrapping” mechanism giving rise to the luminescence. We find that the luminescence decay transient, expressed as a stretched exponential function, can be mathematically converted to a CIS spectrum.

U2 - 10.1063/1.4772475

DO - 10.1063/1.4772475

M3 - Article

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -

Investigation of the thermal charge “trapping-detrapping” in silicon nanocrystals: Correlation of the optical properties with complex impedance spectra

Abstract

UN SDGs

Access to Document

Fingerprint

Cite this