Skip to main navigation Skip to search Skip to main content

Ion beam modification of the structure and properties of hexagonal boron nitride: An infrared and X-ray diffraction study

  • Emily Aradi
  • , S.R. Naidoo
  • , D. G. Billling
  • , D. Wamwangi
  • , I. Motochi
  • , T. E. Derry
    • University of Witwatersrand, Johannesburg

    Research output: Contribution to journal › Article › peer-review

    Abstract

    The vibrational mode for the cubic symmetry of boron nitride (BN) has been produced by boron ion implantation of hexagonal boron nitride (h-BN). The optimum fluence at 150 keV was found to be 5 × 1014 ions/cm2. The presence of the c-BN phase was inferred using glancing incidence XRD (GIXRD) and Fourier Transform Infrared Spectroscopy (FTIR). After implantation, Fourier Transform Infrared Spectroscopy indicated a peak at 1092 cm−1 which corresponds to the vibrational mode for nanocrystalline BN (nc-BN). The glancing angle XRD pattern after implantation exhibited c-BN diffraction peaks relative to the implantation depth of 0.4 μm.

    Keywords

    • Ion implantation
    • Glancing incidence XRD
    • Fourier transform
    • Infrared spectroscopy

    Fingerprint

    Dive into the research topics of 'Ion beam modification of the structure and properties of hexagonal boron nitride: An infrared and X-ray diffraction study'. Together they form a unique fingerprint.

    Cite this