Abstract
Results from multislice simulations are presented which demonstrate that diffracted intensities obtained using precession electron diffraction are less sensitive to the phases of structure factors compared to electron diffraction intensities recorded without precession. Since kinematical diffraction intensities depend only on the moduli of the structure factors, this result supports previous research indicating that the application of precession leads to electron diffraction intensities becoming more kinematical in nature.
Original language | English |
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Pages (from-to) | 763-770 |
Number of pages | 8 |
Journal | Ultramicroscopy |
Volume | 110 |
Issue number | 7 |
DOIs | |
Publication status | Published - Jun 2010 |
Keywords
- Direct methods
- Multislice simulation
- Precession electron diffraction