Lessons Learned the Hard Way

Tobi Delbruck, Ibrahim Abe M. Elfadel, Shahzad Muzaffar, Germain Haessig, Bo Wang, Amine Bermak, Rui Graca, Luis Camunas-Mesa, Bathiya Senevirathna, Pamela Abshire, Bernabe Linares-Barranco, Saeed Afshar, Shih-Chii Liu, Runchun Mark Wang, Piotr Dudek, Stephen Carey, Jose de la Rosa, Marc Dandin, Sheung Lu, Vincent FrickTeresa Serrano-Gotarredona, Paula Lopez, Melika Payvand, Advait Madhavan, Eric Fossum, J. Camilo Vasquez Tieck, Ian Williams, Yan Liu, Timothy Constandinou, Alexander Serb, Ricardo Carmona-Galan, Robert Nawrocki, Walter D. Leon-Salas

Research output: Contribution to conferencePaperpeer-review

Abstract

Fail often to succeed sooner” is a common mantra that we are told is the secret to success. When reporting research results, however, scholars rarely write about their failed attempts and only focus on the successful ones. Perhaps the source of this disconnect between what we preach and what we do can be found in the underlying assumption that published work is meant to move the field forward and failed attempts supposedly do not. The goal of the confessions presented in this paper is to show that even failed attempts are genuine and valuable contributions to our field provided that we learn from our mistakes and correct them. The 27 confessions span from planning oversights, digital and analog design errors, misunderstanding of devices, overlooked parasitics, LVS errors, and troubles in testing.
Original languageEnglish
Number of pages18
DOIs
Publication statusPublished - May 2020

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