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Abstract
Original language | English |
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Article number | 9237995 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 70 |
Early online date | 23 Oct 2020 |
DOIs | |
Publication status | Published - 31 Dec 2020 |
Keywords
- Eddy current (EC)
- lift-off tolerant
- nondestructive testing
- pancake sensor
- thickness measurement
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Dive into the research topics of 'Lift-off tolerant pancake eddy-current sensor for the thickness and spacing measurement of non-magnetic plates'. Together they form a unique fingerprint.Projects
- 1 Active
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Electromagnetic Sensing Group
Peyton, A. (PI), Fletcher, A. (Researcher), Daniels, D. (CoI), Conniffe, D. (PGR student), Podd, F. (PI), Davidson, J. (Researcher), Anderson, J. (Support team), Wilson, J. (Researcher), Marsh, L. (PI), O'Toole, M. (PI), Watson, S. (PGR student), Yin, W. (PI), Regan, A. (PGR student), Williams, K. (Researcher), Rana, S. (Researcher), Khalil, K. (PGR student), Hills, D. (PGR student), Whyte, C. (PGR student), Wang, C. (PGR student), Hodgskin-Brown, R. (PGR student), Dadkhahtehrani, F. (PGR student), Forster, S. (PGR student), Zhu, F. (PGR student), Yu, K. (PGR student), Xiong, L. (PGR student), Lu, T. (PGR student), Zhang, L. (PGR student), Lyu, R. (PGR student), Zhu, R. (PGR student), She, S. (PGR student), Meng, T. (PGR student), Pang, X. (PGR student), Zheng, X. (PGR student), Bai, X. (PGR student), Zou, X. (PGR student), Ding, Y. (PGR student), Shao, Y. (PGR student), Xia, Z. (PGR student), Zhang, Z. (PGR student), Khangerey, R. (PGR student) & Lawless, B. (Researcher)
1/10/04 → …
Project: Research