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Transmission electron microscopy investigation of networks of pentatwinned silver nanowires has identified the presence of nanoscale defects within individual wires, showing narrow regions of banded contrast normal to the nanowire axis (bamboo faults). Structural analysis using machine learning decomposition of scanning precession electron diffraction data identified these bamboo faults as a pair of twist boundaries normal to the wire axis creating low energy coincident site lattices between the faulted region and the parent nanowire. This leads to a conservation of the relative misorientation of the twinned structure within the faulted region leading to an apparent local rotation of the nanowire. Their presence after spraying and non-thermal processing suggests that they may form during nanowire synthesis. However, examination of the networks before and after cyclic straining found an increase in the density of the defects, indicating that they may also form as a result of mechanical deformation.
|Journal||Advanced Engineering Materials|
|Publication status||Accepted/In press - 26 Jun 2023|
- Ag Nanowires
- Transparent Conducting Films
- Coincident Site Lattice
- Grain Boundaries
- Transmission Electron Microscopy
- Scanning Precession Electron Diffraction
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- 1 Finished
Withers, P., Bailey, C. & Lee, P.
1/04/12 → 31/03/22