Abstract
In this report, the low-frequency noise was studied at different electrical biases in an AlGaAs/GaAs-based self-switching diode (SSD), which currently has been demonstrated as a high speed detector up to terahertz frequencies. A typical Lorentzian-typed generation-recombination and 1/f noises were observed in the SSD array at room temperature. The behavior of 1/f noise in the device was in a good agreement with Hooge's mobility fluctuation theory.
| Original language | Undefined |
|---|---|
| Title of host publication | Proceedings of the 2015 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2015 |
| DOIs | |
| Publication status | Published - 2015 |
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