Abstract
Designing a low power clock network in synchronous circuits is an important task. This requirement is stricter for 3-D circuits due to the increased power densities. Resonant clock networks are considered efficient low-power alternatives to conventional clock distribution schemes. These networks utilize additional inductive circuits to reduce the power consumption while delivering a full swing clock signal to the sink nodes. Test is another complex task for 3-D ICs, where pre-bond test is a prerequisite. This paper, consequently, introduces a design methodology for resonant 3-D clock networks that lowers the power of the clock networks while supporting pre-bond test. Several 3-D clock network topologies are explored in a 0.18 μm CMOS technology. Simulation results indicate 43% reduction in the power consumed by the resonant 3-D clock network as compared to a conventional buffered clock network. By properly distributing the inductance within the layers of the 3-D stack, resonance is ensured both in pre-bond test and normal operation. The important aspects of this approach are introduced in this paper.
Original language | English |
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Title of host publication | 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 |
DOIs | |
Publication status | Published - 2012 |
Event | 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 - Eilat, Israel Duration: 14 Nov 2012 → 17 Nov 2012 |
Conference
Conference | 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2012 |
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Country/Territory | Israel |
City | Eilat |
Period | 14/11/12 → 17/11/12 |
Keywords
- 3-D integration
- clock distribution network
- inductive link
- resonant clocking
- wireless testing