Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)

G McMahon; S Burgess; M Takakura; H Takahashi; MG Burke

Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)

G McMahon, S Burgess, M Takakura, H Takahashi, MG Burke

Research output: Contribution to journal › Article › peer-review

Original language	Undefined
Pages (from-to)	440-441
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	22
Issue number	S3
Publication status	Published - 2016

Cite this

@article{424c4726c4574ef68f6c0ec21e2db74a,

title = "Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)",

author = "G McMahon and S Burgess and M Takakura and H Takahashi and MG Burke",

year = "2016",

language = "Undefined",

volume = "22",

pages = "440--441",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "S3",

}

TY - JOUR

T1 - Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)

AU - McMahon, G

AU - Burgess, S

AU - Takakura, M

AU - Takahashi, H

AU - Burke, MG

PY - 2016

Y1 - 2016

M3 - Article

SN - 1431-9276

VL - 22

SP - 440

EP - 441

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - S3

ER -