Mapping residual stress profiles at the micron scale using FIB micro-hole drilling

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	267-272
Number of pages	6
Journal	Applied Mechanics and Materials
Volume	24-25
DOIs	https://doi.org/doi:10.4028/www.scientific.net/AMM.24-25.267
Publication status	Published - 2010

Access to Document

@article{644852c75f0a414a9f54bd9945144c6d,

title = "Mapping residual stress profiles at the micron scale using FIB micro-hole drilling",

author = "B Winiarski and PJ Withers",

year = "2010",

doi = "doi:10.4028/www.scientific.net/AMM.24-25.267",

language = "English",

volume = "24-25",

pages = "267--272",

journal = "Applied Mechanics and Materials",

issn = "1662-7482",

publisher = "Trans Tech Publications Ltd",

}

TY - JOUR

T1 - Mapping residual stress profiles at the micron scale using FIB micro-hole drilling

AU - Winiarski, B

AU - Withers, PJ

PY - 2010

Y1 - 2010

U2 - doi:10.4028/www.scientific.net/AMM.24-25.267

DO - doi:10.4028/www.scientific.net/AMM.24-25.267

M3 - Article

SN - 1662-7482

VL - 24-25

SP - 267

EP - 272

JO - Applied Mechanics and Materials

JF - Applied Mechanics and Materials

ER -