Mapping the ultrafast charge transfer in van der Waals heterostructures

  • M. Plankl
  • , M. Zizlsperger
  • , F. Mooshammer
  • , F. Schiegl
  • , F. Sandner
  • , T. Siday
  • , M.A. Huber
  • , J.L. Boland
  • , T.L. Cocker
  • , Rupert Huber

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

We employ THz near-field microscopy to investigate ultrafast interlayer charge transfer in van der Waals heterostructures (HS) by tracing the resulting THz emission on the nanoscale. We further employ a novel concept of contact-free tunneling microscopy to monitor the interlayer electron-hole (e-h) pair population through its build up and decay, providing access to the ultrafast carrier dynamics with spatial resolution orders of magnitude better than the diffraction limit.
Original languageEnglish
Title of host publication2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2020
PublisherIEEE
Pages474-475
Number of pages2
ISBN (Electronic)9781728166209
ISBN (Print)9781728166209
DOIs
Publication statusPublished - 8 Nov 2020

Publication series

Name2020 45TH INTERNATIONAL CONFERENCE ON INFRARED, MILLIMETER, AND TERAHERTZ WAVES (IRMMW-THZ)
ISSN (Print)2162-2027

Research Beacons, Institutes and Platforms

  • Photon Science Institute

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