| Original language | English |
|---|---|
| Pages (from-to) | 41-47 |
| Number of pages | 7 |
| Journal | Journal of Microscopy |
| Volume | 139 |
| Issue number | 1 |
| Publication status | Published - 1985 |
Measurement of characteristic wavelengths in modulated microstructures by field-ion microscopy
- MK Miller
- , MG Burke
- , SS Brenner
Research output: Contribution to journal › Article › peer-review