Micromechanics of domain switching in rhombohedral PZT ceramics

D. A. Hall, A. Steuwer, B. Cherdhirunkorn, P. J. Withers, T. Mori

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The lattice strain ε{2 0 0} and diffraction peak intensity ratio R{1 1 1} have been determined in soft rhombohedral PZT ceramics during the application of an electric field up to 2.5 MV m-1 and as a function of the grain orientation ψ, using high energy synchtron X-ray diffraction. The magnitude of both ε{2 0 0} and R{1 1 1} increased sharply beyond a field level of 1 MV m-1 due to the onset of ferroelectric domain switching. ε{2 0 0} exhibited a near linear dependence on cos2 ψ, in agreement with previous studies of the remanent-poled state. In contrast, the R{1 1 1}-cos2 ψ plot showed evidence of saturation in ferroelectric domain switching, particularly for ψ > 60°. The development of lattice strain during poling is discussed in terms of contributions from the intrinsic piezoelectric effect and from residual stress caused by differences in the poling strain of a grain, and the piezoelectric strain of a grain relative to its surroundings. © 2007 Elsevier Ltd and Techna Group S.r.l.
    Original languageEnglish
    Pages (from-to)679-683
    Number of pages4
    JournalCeramics International
    Volume34
    Issue number4
    DOIs
    Publication statusPublished - May 2008

    Keywords

    • B. X-ray methods
    • C. Ferroelectric properties
    • D. PZT
    • Residual stress

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