Microstructural imaging of Ferromagnetic material using Integrated Quantum Well Hall Effect Sensor Arrays.

Chen Wei Liang, James Sexton, Mohammadreza Sadeghi, Mohamed Missous

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

The detailed microstructures of a material can affect its mechanical, electrical and optical properties. In ferromagnetic materials, domain walls and grain boundaries are largely responsible for defining the microstructures. A key method to analyse the microstructure of a ferromagnetic material is to measure the Magnetic Field Leakage (MFL) from its grain boundary/domain walls. The vast majority of materials require a micro scale magnetic field sensor to image the grains and domains. In this work, high sensitivity low noise Quantum Well Hall Effect (QWHE) sensor arrays have been designed and fabricated using InGaAs-AlGaAs or metamorphic InGaAs-InAlAs heterostructures. A range of sensor arrays with individual sensor size varying from 400 µm2 down to 4 µm2 were prepared, packaged and mounted onto a precision XYZ stepper platform for magnetic field mapping. Clear images of both micron scale defects and microstructure image are demonstrated and analysed.

Original languageEnglish
Title of host publication58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019
PublisherBritish Institute of Non-Destructive Testing
ISBN (Electronic)9781510893733
Publication statusPublished - 1 Jan 2019
Event58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019 - Telford, United Kingdom
Duration: 3 Sept 20195 Sept 2019

Publication series

Name58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019

Conference

Conference58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019
Country/TerritoryUnited Kingdom
CityTelford
Period3/09/195/09/19

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