TY - GEN
T1 - Microstructural imaging of Ferromagnetic material using Integrated Quantum Well Hall Effect Sensor Arrays.
AU - Liang, Chen Wei
AU - Sexton, James
AU - Sadeghi, Mohammadreza
AU - Missous, Mohamed
PY - 2019/1/1
Y1 - 2019/1/1
N2 - The detailed microstructures of a material can affect its mechanical, electrical and optical properties. In ferromagnetic materials, domain walls and grain boundaries are largely responsible for defining the microstructures. A key method to analyse the microstructure of a ferromagnetic material is to measure the Magnetic Field Leakage (MFL) from its grain boundary/domain walls. The vast majority of materials require a micro scale magnetic field sensor to image the grains and domains. In this work, high sensitivity low noise Quantum Well Hall Effect (QWHE) sensor arrays have been designed and fabricated using InGaAs-AlGaAs or metamorphic InGaAs-InAlAs heterostructures. A range of sensor arrays with individual sensor size varying from 400 µm2 down to 4 µm2 were prepared, packaged and mounted onto a precision XYZ stepper platform for magnetic field mapping. Clear images of both micron scale defects and microstructure image are demonstrated and analysed.
AB - The detailed microstructures of a material can affect its mechanical, electrical and optical properties. In ferromagnetic materials, domain walls and grain boundaries are largely responsible for defining the microstructures. A key method to analyse the microstructure of a ferromagnetic material is to measure the Magnetic Field Leakage (MFL) from its grain boundary/domain walls. The vast majority of materials require a micro scale magnetic field sensor to image the grains and domains. In this work, high sensitivity low noise Quantum Well Hall Effect (QWHE) sensor arrays have been designed and fabricated using InGaAs-AlGaAs or metamorphic InGaAs-InAlAs heterostructures. A range of sensor arrays with individual sensor size varying from 400 µm2 down to 4 µm2 were prepared, packaged and mounted onto a precision XYZ stepper platform for magnetic field mapping. Clear images of both micron scale defects and microstructure image are demonstrated and analysed.
UR - http://www.scopus.com/inward/record.url?scp=85073803460&partnerID=8YFLogxK
M3 - Conference contribution
T3 - 58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019
BT - 58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019
PB - British Institute of Non-Destructive Testing
T2 - 58th Annual Conference of the British Institute of Non-Destructive Testing, NDT 2019
Y2 - 3 September 2019 through 5 September 2019
ER -