Microwave power detector based on a single MOSFET in standard technology

Giorgio Ferrari, Enrico Prati, Laura Fumagalli, Marco Sampietro, Marco Fanciulli

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    A microwave power detector based on a single metal-oxide-semiconductor field effect transistor (MOSFET) fully compatible with standard CMOS process is presented. The detector uses the non-linearity of the channel resistance of a MOSFET operating in ohmic regime to rectify the microwave signal. A first prototype shows a sensitivity below mW and a good linearity over at least two decades of microwave power. The absence of additional technological steps required for the detector fabrication with respect to a standard CMOS process opens the realm of RF power monitoring in products at virtually no cost.

    Original languageEnglish
    Title of host publicationThe 35th European Microwave Conference
    Subtitle of host publicationConference Proceedings
    Place of PublicationParis, France
    Pages1207-1210
    Number of pages4
    Volume2
    DOIs
    Publication statusPublished - 1 Dec 2005
    Event2005 European Microwave Conference - Paris, France
    Duration: 4 Oct 20056 Oct 2005

    Conference

    Conference2005 European Microwave Conference
    Country/TerritoryFrance
    CityParis
    Period4/10/056/10/05

    Keywords

    • CMOS integrated circuits
    • Control nonlinearities
    • Microwave power transmission
    • Signal detection

    Fingerprint

    Dive into the research topics of 'Microwave power detector based on a single MOSFET in standard technology'. Together they form a unique fingerprint.

    Cite this