Abstract
A microwave power detector based on a single metal-oxide-semiconductor field effect transistor (MOSFET) fully compatible with standard CMOS process is presented. The detector uses the non-linearity of the channel resistance of a MOSFET operating in ohmic regime to rectify the microwave signal. A first prototype shows a sensitivity below mW and a good linearity over at least two decades of microwave power. The absence of additional technological steps required for the detector fabrication with respect to a standard CMOS process opens the realm of RF power monitoring in products at virtually no cost.
Original language | English |
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Title of host publication | The 35th European Microwave Conference |
Subtitle of host publication | Conference Proceedings |
Place of Publication | Paris, France |
Pages | 1207-1210 |
Number of pages | 4 |
Volume | 2 |
DOIs | |
Publication status | Published - 1 Dec 2005 |
Event | 2005 European Microwave Conference - Paris, France Duration: 4 Oct 2005 → 6 Oct 2005 |
Conference
Conference | 2005 European Microwave Conference |
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Country/Territory | France |
City | Paris |
Period | 4/10/05 → 6/10/05 |
Keywords
- CMOS integrated circuits
- Control nonlinearities
- Microwave power transmission
- Signal detection