Abstract
In this work, double-gated field effect transistors manufactured from monolayer graphene are investigated. Conventional top-down CMOS-compatible processes are applied except for graphene deposition by manual exfoliation. Carrier mobilities in single- and double-gated graphene field effect transistors are compared. Even in double-gated graphene FETs, the carrier mobility exceeds the universal mobility of silicon over nearly the entire measured range. At comparable dimensions, reported mobilities for ultra-thin body silicon-on-insulator MOSFETs cannot compete with graphene FET values. © 2007 Elsevier Ltd. All rights reserved.
Original language | English |
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Pages (from-to) | 514-518 |
Number of pages | 4 |
Journal | Solid State Electronics |
Volume | 52 |
Issue number | 4 |
DOIs | |
Publication status | Published - Apr 2008 |
Keywords
- Field effect transistor
- Graphene
- Mobility
- SOI