TY - GEN
T1 - Multi-Partner Project: Twinning for Excellence in Reliable Electronics (TWIN-RELECT)
AU - Andjelkovic, Marko
AU - Vargas, Fabian
AU - Krstic, Milos
AU - Dilillo, Luigi
AU - Michez, Alain
AU - Wrobel, Frederic
AU - Bertozzi, Davide
AU - Luján, Mikel
AU - Georgakidis, Christos
AU - Chatzivangelis, Nikolaos
AU - Tsilingiri, Katerina
AU - Zazatis, Nikolaos Zazatis
AU - Paliaroutis, Georgios Ioanis
AU - Tsoumanis, Pelopidas
AU - Sotiriou, Christos
PY - 2025/1/17
Y1 - 2025/1/17
N2 - Reliable electronics plays a major role in shaping our daily lives, being a key enabler for critical applications, such as space missions, avionics, automotive, medicine, banking, automated industry, wireless communication networks, etc. However, design of highly reliable electronic systems remains a challenge with the advances in semiconductor technology and increase in integrated circuit (IC) complexity. In this work, we introduce the Horizon Europe Twinning project TWIN-RELECT, aimed at strengthening the scientific expertise in designing reliable integrated circuits. The paper presents the general project concept and objectives, and main directions of the joint research activities. The primary scientific goal is to contribute to the development of novel, more efficient, European Electronic Design Automation (EDA) tool-chain for design of reliable chips.
AB - Reliable electronics plays a major role in shaping our daily lives, being a key enabler for critical applications, such as space missions, avionics, automotive, medicine, banking, automated industry, wireless communication networks, etc. However, design of highly reliable electronic systems remains a challenge with the advances in semiconductor technology and increase in integrated circuit (IC) complexity. In this work, we introduce the Horizon Europe Twinning project TWIN-RELECT, aimed at strengthening the scientific expertise in designing reliable integrated circuits. The paper presents the general project concept and objectives, and main directions of the joint research activities. The primary scientific goal is to contribute to the development of novel, more efficient, European Electronic Design Automation (EDA) tool-chain for design of reliable chips.
KW - Reliable integrated circuits
KW - EDA tools
KW - transient faults
KW - permanent faults
M3 - Conference contribution
BT - Design Automation and Test in Europe Conference 2025
ER -