Multiple module pixellated CdTe spectroscopic X-ray detector

Matthew D Wilson, Steven J Bell, Robert J Cernik, Christiana Christodoulou, Christopher K Egan, Daniel O'Flynn, Simon Jacques, Silvia Pani, James Scuffham, Paul Seller, Paul J Sellin, Robert Speller, Matthew C Veale

    Research output: Contribution to journalArticlepeer-review

    Abstract

    A pixellated CdTe detector system comprising 2 × 2 detector modules has been developed for high energy spectroscopic X-ray imaging applications and has an active area of 16 cm2. The detector modules are made from the HEXITEC 80 × 80 ASIC and 1 mm thick CdTe with Al-Schottky contacts. The CdTe has 250 μm pitch pixels with an outer guard ring on the same pitch. The single HEXITEC 80 × 80 detectors have an av. energy resoln. (FWHM) of 800 eV at 59.9 keV. Limitations in the multiple module DAQ system mean that the energy resoln. of the pixels in the 2 × 2 detector array is 2.0 keV at 59.9 keV. The spacing between the tiled detector modules is 150 μm which results in an inactive area equiv. to 3 pixels, including the guard ring on the edge of the detectors. The modular detector configuration demonstrates the potential to create large area detector arrays in the future. [on SciFinder(R)]
    Original languageEnglish
    Pages (from-to)1197-1200
    Number of pages4
    JournalIEEE Transactions on Nuclear Science
    Volume60
    Issue number2, Pt. 1
    DOIs
    Publication statusPublished - 2013

    Keywords

    • X-ray detectors (multiple module pixellated CdTe spectroscopic X-ray detector)
    • Optical imaging devices (x-ray converters
    • multiple module pixellated CdTe spectroscopic X-ray detector)
    • cadmium telluride x ray detector

    Fingerprint

    Dive into the research topics of 'Multiple module pixellated CdTe spectroscopic X-ray detector'. Together they form a unique fingerprint.

    Cite this