Multivariate analysis of pixelated diffraction data

C. Christodoulou; C. B. Reid; D. O'Flynn; M. Wilson; M. Veale; R. J. Cernik; P. Seller; R. D. Speller

doi:10.1088/1748-0221/6/12/C12027

Multivariate analysis of pixelated diffraction data

C. Christodoulou, C. B. Reid, D. O'Flynn, M. Wilson, M. Veale, R. J. Cernik, P. Seller, R. D. Speller

Research output: Chapter in Book/Conference proceeding › Conference contribution

Abstract

A novel pixelated ASIC detector using Cadmium Telluride is applied to a combined energy dispersive- and angular dispersive- X-ray diffraction system. This system is designed to obtain multiple diffraction signatures of powdered materials simultaneously. The diffraction data is analyzed using multivariate partial least squares regression utilizing the diffraction spectra at multiple scatter angles, and material concentration in a three-way regression analysis. The calibration models are used to predict unknown samples, and show that utilizing the angular information can help improve concentration prediction in samples of mixtures and has potential in material identification systems. © 2011 IOP Publishing Ltd and SISSA.

Original language	English
Title of host publication	Journal of Instrumentation\|J. Instrum.
Volume	6
DOIs	https://doi.org/10.1088/1748-0221/6/12/C12027
Publication status	Published - Dec 2011
Event	9th International Conference on Position Sensitive Detectors - Aberystwyth, WALES Duration: 12 Sept 2011 → 16 Sept 2011 http://iopscience.iop.org/1748-0221/6/12/C12027/pdf/1748-0221_6_12_C12027.pdf

Conference

Conference	9th International Conference on Position Sensitive Detectors
City	Aberystwyth, WALES
Period	12/09/11 → 16/09/11
Internet address	http://iopscience.iop.org/1748-0221/6/12/C12027/pdf/1748-0221_6_12_C12027.pdf

Keywords

Pixelated detectors and associated VLSI electronics
X-ray diffraction detectors

Access to Document

10.1088/1748-0221/6/12/C12027

Cite this

@inproceedings{9b7a7032f53e4b35843d832ef47bbe2d,

title = "Multivariate analysis of pixelated diffraction data",

abstract = "A novel pixelated ASIC detector using Cadmium Telluride is applied to a combined energy dispersive- and angular dispersive- X-ray diffraction system. This system is designed to obtain multiple diffraction signatures of powdered materials simultaneously. The diffraction data is analyzed using multivariate partial least squares regression utilizing the diffraction spectra at multiple scatter angles, and material concentration in a three-way regression analysis. The calibration models are used to predict unknown samples, and show that utilizing the angular information can help improve concentration prediction in samples of mixtures and has potential in material identification systems. {\textcopyright} 2011 IOP Publishing Ltd and SISSA.",

keywords = "Pixelated detectors and associated VLSI electronics, X-ray diffraction detectors",

author = "C. Christodoulou and Reid, {C. B.} and D. O'Flynn and M. Wilson and M. Veale and Cernik, {R. J.} and P. Seller and Speller, {R. D.}",

year = "2011",

month = dec,

doi = "10.1088/1748-0221/6/12/C12027",

language = "English",

volume = "6",

booktitle = "Journal of Instrumentation|J. Instrum.",

note = "9th International Conference on Position Sensitive Detectors ; Conference date: 12-09-2011 Through 16-09-2011",

url = "http://iopscience.iop.org/1748-0221/6/12/C12027/pdf/1748-0221_6_12_C12027.pdf",

}

TY - GEN

T1 - Multivariate analysis of pixelated diffraction data

AU - Christodoulou, C.

AU - Reid, C. B.

AU - O'Flynn, D.

AU - Wilson, M.

AU - Veale, M.

AU - Cernik, R. J.

AU - Seller, P.

AU - Speller, R. D.

PY - 2011/12

Y1 - 2011/12

N2 - A novel pixelated ASIC detector using Cadmium Telluride is applied to a combined energy dispersive- and angular dispersive- X-ray diffraction system. This system is designed to obtain multiple diffraction signatures of powdered materials simultaneously. The diffraction data is analyzed using multivariate partial least squares regression utilizing the diffraction spectra at multiple scatter angles, and material concentration in a three-way regression analysis. The calibration models are used to predict unknown samples, and show that utilizing the angular information can help improve concentration prediction in samples of mixtures and has potential in material identification systems. © 2011 IOP Publishing Ltd and SISSA.

AB - A novel pixelated ASIC detector using Cadmium Telluride is applied to a combined energy dispersive- and angular dispersive- X-ray diffraction system. This system is designed to obtain multiple diffraction signatures of powdered materials simultaneously. The diffraction data is analyzed using multivariate partial least squares regression utilizing the diffraction spectra at multiple scatter angles, and material concentration in a three-way regression analysis. The calibration models are used to predict unknown samples, and show that utilizing the angular information can help improve concentration prediction in samples of mixtures and has potential in material identification systems. © 2011 IOP Publishing Ltd and SISSA.

KW - Pixelated detectors and associated VLSI electronics

KW - X-ray diffraction detectors

U2 - 10.1088/1748-0221/6/12/C12027

DO - 10.1088/1748-0221/6/12/C12027

M3 - Conference contribution

VL - 6

BT - Journal of Instrumentation|J. Instrum.

T2 - 9th International Conference on Position Sensitive Detectors

Y2 - 12 September 2011 through 16 September 2011

ER -

Multivariate analysis of pixelated diffraction data

Abstract

Conference

Keywords

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