Nanometre resolution using high-resolution scanning electron microscopy corroborated by atomic force microscopy

Sam M. Stevens, Pablo Cubillas, Kjell Jansson, Osamu Terasaki, Michael W. Anderson, Paul A. Wright, María Castro

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The resolving power of high-resolution scanning electron microscopy was judged using topographical height data from atomic force microscopy in order to assess the technique as a tool for understanding nanoporous crystal growth. © The Royal Society of Chemistry.
    Original languageEnglish
    Pages (from-to)3894-3896
    Number of pages2
    JournalChemical Communications
    Issue number33
    DOIs
    Publication statusPublished - 2008

    Keywords

    • ZEOLITES
    • CRYSTALS
    • GROWTH

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