Nanoscale Near-Field Tomography of Surface States on (Bi(0.5)b(0.5))(2)Te-3

Fabian Mooshammer; Fabian Sander; Markus Huber; Martin Zizlsperger; Helena Weigand; Markus Plankl; Christian  Weyrich; Martin Lanius; Jörn Kampmeier; Gregor Mussler; Detlev Grützmacher; Jessica Louise Boland; Tyler Cocker; Rupert Huber

doi:10.1021/acs.nanolett.8b03008

Nanoscale Near-Field Tomography of Surface States on (Bi(0.5)b(0.5))(2)Te-3

Fabian Mooshammer
, Fabian Sander
, Markus Huber
, Martin Zizlsperger
, Helena Weigand
, Markus Plankl
, Christian Weyrich
, Martin Lanius
, Jörn Kampmeier
, Gregor Mussler
, Detlev Grützmacher
, Jessica Louise Boland
, Tyler Cocker
, Rupert Huber

Universitat Regensburg
Forschungszentrum Jülich gmbh
Michigan State University

Research output: Contribution to journal › Article › peer-review

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Abstract

Three-dimensional topological insulators (TIs) have attracted tremendous interest for their possibility to host massless Dirac Fermions in topologically protected surface states (TSSs), which may enable new kinds of high-speed electronics. However, recent reports have outlined the importance of band bending effects within these materials, which results in an additional two-dimensional electron gas (2DEG) with finite mass at the surface. TI surfaces are also known to be highly inhomogeneous on the nanoscale, which is masked in conventional far-field studies. Here, we use near-field microscopy in the mid-infrared spectral range to probe the local surface properties of custom-tailored (Bi0.5Sb0.5)2Te3 structures with nanometer precision in all three spatial dimensions. Applying nanotomography and nanospectroscopy, we reveal a few-nanometer-thick layer of high surface conductivity and retrieve its local dielectric function without assuming any model for the spectral response. This allows us to directly distin...

Original language	English
Pages (from-to)	7515-7523
Number of pages	9
Journal	Nano Letters
Volume	18
Issue number	12
Early online date	13 Nov 2018
DOIs	https://doi.org/10.1021/acs.nanolett.8b03008
Publication status	Published - 12 Dec 2018

Keywords

Near-field microscopy
SNOM
band bending
surface state
tomography
topological insulator

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10.1021/acs.nanolett.8b03008

TIManuscriptAccepted author manuscript, 5.02 MB

Cite this

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title = "Nanoscale Near-Field Tomography of Surface States on (Bi(0.5)b(0.5))(2)Te-3",

abstract = "Three-dimensional topological insulators (TIs) have attracted tremendous interest for their possibility to host massless Dirac Fermions in topologically protected surface states (TSSs), which may enable new kinds of high-speed electronics. However, recent reports have outlined the importance of band bending effects within these materials, which results in an additional two-dimensional electron gas (2DEG) with finite mass at the surface. TI surfaces are also known to be highly inhomogeneous on the nanoscale, which is masked in conventional far-field studies. Here, we use near-field microscopy in the mid-infrared spectral range to probe the local surface properties of custom-tailored (Bi0.5Sb0.5)2Te3 structures with nanometer precision in all three spatial dimensions. Applying nanotomography and nanospectroscopy, we reveal a few-nanometer-thick layer of high surface conductivity and retrieve its local dielectric function without assuming any model for the spectral response. This allows us to directly distin...",

keywords = "Near-field microscopy, SNOM, band bending, surface state, tomography, topological insulator",

author = "Fabian Mooshammer and Fabian Sander and Markus Huber and Martin Zizlsperger and Helena Weigand and Markus Plankl and Christian Weyrich and Martin Lanius and J{\"o}rn Kampmeier and Gregor Mussler and Detlev Gr{\"u}tzmacher and Boland, \{Jessica Louise\} and Tyler Cocker and Rupert Huber",

year = "2018",

month = dec,

day = "12",

doi = "10.1021/acs.nanolett.8b03008",

language = "English",

volume = "18",

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journal = "Nano Letters",

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AU - Mooshammer, Fabian

AU - Sander, Fabian

AU - Huber, Markus

AU - Zizlsperger, Martin

AU - Weigand, Helena

AU - Plankl, Markus

AU - Weyrich, Christian

AU - Lanius, Martin

AU - Kampmeier, Jörn

AU - Mussler, Gregor

AU - Grützmacher, Detlev

AU - Boland, Jessica Louise

AU - Cocker, Tyler

AU - Huber, Rupert

PY - 2018/12/12

Y1 - 2018/12/12

N2 - Three-dimensional topological insulators (TIs) have attracted tremendous interest for their possibility to host massless Dirac Fermions in topologically protected surface states (TSSs), which may enable new kinds of high-speed electronics. However, recent reports have outlined the importance of band bending effects within these materials, which results in an additional two-dimensional electron gas (2DEG) with finite mass at the surface. TI surfaces are also known to be highly inhomogeneous on the nanoscale, which is masked in conventional far-field studies. Here, we use near-field microscopy in the mid-infrared spectral range to probe the local surface properties of custom-tailored (Bi0.5Sb0.5)2Te3 structures with nanometer precision in all three spatial dimensions. Applying nanotomography and nanospectroscopy, we reveal a few-nanometer-thick layer of high surface conductivity and retrieve its local dielectric function without assuming any model for the spectral response. This allows us to directly distin...

AB - Three-dimensional topological insulators (TIs) have attracted tremendous interest for their possibility to host massless Dirac Fermions in topologically protected surface states (TSSs), which may enable new kinds of high-speed electronics. However, recent reports have outlined the importance of band bending effects within these materials, which results in an additional two-dimensional electron gas (2DEG) with finite mass at the surface. TI surfaces are also known to be highly inhomogeneous on the nanoscale, which is masked in conventional far-field studies. Here, we use near-field microscopy in the mid-infrared spectral range to probe the local surface properties of custom-tailored (Bi0.5Sb0.5)2Te3 structures with nanometer precision in all three spatial dimensions. Applying nanotomography and nanospectroscopy, we reveal a few-nanometer-thick layer of high surface conductivity and retrieve its local dielectric function without assuming any model for the spectral response. This allows us to directly distin...

KW - Near-field microscopy

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KW - band bending

KW - surface state

KW - tomography

KW - topological insulator

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M3 - Article

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JO - Nano Letters

JF - Nano Letters

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ER -

Nanoscale Near-Field Tomography of Surface States on (Bi(0.5)b(0.5))(2)Te-3

Abstract

Keywords

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Humboldt Research Fellowship

Non-destructive 3D imaging and spectroscopy of surfaces via near-field optical microscopy

Terahertz lights up the nanoscale:Revealing the nanoscale optoelectronic properties of low-dimensional materials via terahertz spectroscopy and microscopy.

Terahertz spectroscopy and microscopy for non-destructive nanoscale optoelectronic characterisation of advanced functional nanomaterials

Cite this

Nanoscale Near-Field Tomography of Surface States on (Bi(0.5)b(0.5))(2)Te-3

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Research output

Data archive of "Nanoscale Near-Field Tomography of Surface States on (Bi0.5Sb0.5)2Te3"

Prizes

Humboldt Research Fellowship

Activities

Non-destructive 3D imaging and spectroscopy of surfaces via near-field optical microscopy

Terahertz lights up the nanoscale:Revealing the nanoscale optoelectronic properties of low-dimensional materials via terahertz spectroscopy and microscopy.

Terahertz spectroscopy and microscopy for non-destructive nanoscale optoelectronic characterisation of advanced functional nanomaterials

Cite this